ISBN: 9783319936826 - reliability physics and engineering: time-to-failure modeling (16 resultados)

Condición: good. Book has corner edge dings and or scratches and signs of light wear.

Condición: New.

Condición: New. pp. 318.

Condición: New. pp. 318.

Condición: As New. Unread book in perfect condition.

Condición: New.

Condición: New.

Condición: New. In English.

Condición: As New. Unread book in perfect condition.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes- all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.…

Hardcover. Condición: Brand New. 3rd edition. 463 pages. 9.50x6.50x1.25 inches. In Stock.

Condición: new. Questo è un articolo print on demand.

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes- all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases. 484 pp. Englisch.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. J.W. McPherson is recognized internationally as an expert in Reliability Physics & Engineering. He has published over 200 papers on reliability, authored the Reliability Chapters for 4 Books, awarded 15 patents, and holds the title of Texas Instruments S.…

Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Provides comprehensive textbook on reliability physics of semiconductors, from fundamentals to applicationsExplains the fundamentals of reliability physics and engineering tools for building better productsContains statistical training and tools within the textIncludes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 484 pp. Englisch.…

Condición: New. PRINT ON DEMAND pp. 318.