9783319353029 - Laboratory Micro-X-Ray Fluorescence Spectroscopy: Instrumentation and Applications: 55 (Springer Series in Surface Sciences) de Haschke, Michael (12 resultados)

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Condición: New. pp. 374 Softcover reprint of the original 1st ed. 2014 edition NO-PA16APR2015-KAP.

Taschenbuch. Condición: Neu. Laboratory Micro-X-Ray Fluorescence Spectroscopy | Instrumentation and Applications | Michael Haschke | Taschenbuch | xviii | Englisch | 2016 | Springer | EAN 9783319353029 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.

Paperback. Condición: Brand New. reprint edition. 376 pages. 9.25x6.10x0.89 inches. In Stock.

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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a description of the main instrumental influences on the analytical performanceDiscusses the different quantification models of X-ray measurements considering the special requirements to the analysis of non-homogeneous materialsSuppli.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions. 376 pp. Englisch.

Condición: New. Print on Demand pp. 374.

Condición: New. PRINT ON DEMAND pp. 374.

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 376 pp. Englisch.