9783030520168 - dependable embedded systems (16 resultados)
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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Librería: Revaluation Books, Exeter, , Reino UnidoRevaluation Books
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Hardcover. Condición: Brand New. 621 pages. 9.25x6.10x1.61 inches. In Stock.
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 53,49
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from tod…ay's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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EUR 100,00
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Hardcover. Condición: New. New. book.
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Librería: Buchpark, Trebbin, , AlemaniaBuchpark
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Condición: Hervorragend. Zustand: Hervorragend | Seiten: 624 | Sprache: Englisch | Produktart: Bücher | This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent…reliability concerns from today¿s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 46,22
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Condición: new. Questo è un articolo print on demand.
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 53,49
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability c…oncerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems. 624 pp. Englisch.
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Librería: Majestic Books, Hounslow, , Reino UnidoMajestic Books
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EUR 75,31
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 73,81
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Condición: New. PRINT ON DEMAND.
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Librería: moluna, Greven, , Alemaniamoluna
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EUR 48,37
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systemsDescribes cross-layer approaches that can leverage reliability through techni…ques that are pro-actively designed with.
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
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EUR 53,49
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Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability conce…rns from today¿s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 624 pp. Englisch.
