9783030307257 - nanoelectronic coupled problems solutions: 29 (mathematics in industry, 29) (18 resultados)
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Nanoelectronic Coupled Problems Solutions
ter Maten, E. Jan W. (EDT); Brachtendorf, Hans-georg (EDT); Pulch, Roland (EDT); Schoenmaker, Wim (EDT); De Gersem, Herbert (EDT)
Idioma: Inglés
Editorial: Springer, 2019
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Nanoelectronic Coupled Problems Solutions
ter Maten, E. Jan W. (EDT); Brachtendorf, Hans-georg (EDT); Pulch, Roland (EDT); Schoenmaker, Wim (EDT); De Gersem, Herbert (EDT)
Idioma: Inglés
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Condición: New. pp. XXX, 587 300 illus., 200 illus. in color. 1st ed. 2019 edition NO-PA16APR2015-KAP.
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Nanoelectronic Coupled Problems Solutions
ter Maten, E. Jan W. (EDT); Brachtendorf, Hans-georg (EDT); Pulch, Roland (EDT); Schoenmaker, Wim (EDT); De Gersem, Herbert (EDT)
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Nanoelectronic Coupled Problems Solutions
ter Maten, E. Jan W. (EDT); Brachtendorf, Hans-georg (EDT); Pulch, Roland (EDT); Schoenmaker, Wim (EDT); De Gersem, Herbert (EDT)
Idioma: Inglés
Editorial: Springer, 2019
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction l…evels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms' industrial applicability.
Nanoelectronic Coupled Problems Solutions (Mathematics in Industry)
ter Maten, E. Jan W. (Editor) / Brachtendorf, Hans-Georg (Editor) / Pulch, Roland (Editor) / Schoenmaker, Wim (Editor) / De Gersem, Herbert (Editor)
Idioma: Inglés
Editorial: Springer, 2019
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Hardcover. Condición: Brand New. 620 pages. 9.25x6.10x1.54 inches. In Stock.
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Hardcover. Condición: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condición: new. Questo è un articolo print on demand.
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Condición: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
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Idioma: Inglés
Editorial: Springer International Publishing Nov 2019, 2019
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of high…er abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms' industrial applicability. 620 pp. Englisch.
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Condición: New. Print on Demand pp. XXX, 587 300 illus., 200 illus. in color.
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Condición: New. PRINT ON DEMAND pp. XXX, 587 300 illus., 200 illus. in color.
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Nanoelectronic Coupled Problems Solutions
ter Maten, E. Jan W.|Brachtendorf, Hans-Georg|Pulch, Roland|Schoenmaker, Wim|De Gersem, Herbert
Idioma: Inglés
Editorial: Springer International Publishing, 2019
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Combines advanced methods for solving strongly coupled problems involving multirate dynamics in time and frequency domain with applications to Uncertainty Quantification and Fast Fault SimulationUnique ingre…dient is provided by parametri.
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Idioma: Inglés
Editorial: Springer, Springer VS Nov 2019, 2019
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Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher a…bstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing;(2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma);(3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated.All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms' industrial applicability.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 620 pp. Englisch.
