Isbn: 9783030136536 - atomic force microscopy (nanoscience and technology) (24 resultados)

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HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Condición: New.

Condición: As New. Unread book in perfect condition.

Hardcover. Condición: New.

Condición: New. In English.

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Condición: As New. Unread book in perfect condition.

Hardback. Condición: New. Second Edition 2019. This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.…

Condición: New.

Condición: New. Offers a full color pedagogic approach to atomic force microscopyPresents the fundamentals of the technique in detailDiscusses related technical aspects in depthProf. Dr. rer. nat. Bert Voigtlaender studied Physics at the Univ.

Condición: New.

Hardback. Condición: New. Second Edition 2019. This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.…

Hardcover. Condición: Brand New. 2nd ed. 2019 edition. 348 pages. 9.25x6.10x0.94 inches. In Stock.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to 'Scanning Probe Microscopy' (Springer, 2015)represents a substantial extension andrevision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner.Whileprimarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this bookis also usefulfor professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.…

Hardcover. Condición: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condición: new. Questo è un articolo print on demand.

Hardcover. Condición: Brand New. 2nd ed. 2019 edition. 348 pages. 9.25x6.10x0.94 inches. In Stock. This item is printed on demand.

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to 'Scanning Probe Microscopy' (Springer, 2015)represents a substantial extension andrevision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner.Whileprimarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this bookis also usefulfor professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab. 348 pp. Englisch.…

Buch. Condición: Neu. Atomic Force Microscopy | Bert Voigtländer | Buch | xiv | Englisch | 2019 | Springer | EAN 9783030136536 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.

Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to 'Scanning Probe Microscopy' (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 348 pp. Englisch. …

Condición: New. Print on Demand.

Condición: New. PRINT ON DEMAND.