Isbn: 9781489992963 - analog circuit design for process variation-resilient systems-on-a-chip (13 resultados)

Paperback. Condición: New.

Condición: New. In English.

Condición: New. pp. 192.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;Includes built-in testing techniques, linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.…

Paperback. Condición: Brand New. 192 pages. 9.00x6.00x0.50 inches. In Stock.

Taschenbuch. Condición: Neu. Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip | Marvin Onabajo (u. a.) | Taschenbuch | xviii | Englisch | 2014 | Springer | EAN 9781489992963 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

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Condición: new. Questo è un articolo print on demand.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;Includes built-in testing techniques, linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques. 192 pp. Englisch.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters Includes built-in testing techniques, linked to current industrial trends Balances digitally-. …

Condición: New. Print on Demand pp. 192 125 Figures, 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

Condición: New. PRINT ON DEMAND pp. 192.

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;Includes built-in testing techniques, linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 192 pp. Englisch.…