9781489977908 - Atom-Probe Tomography: The Local Electrode Atom Probe de Miller, Michael K. K. (10 resultados)

Taschenbuch. Condición: Neu. Atom-Probe Tomography | The Local Electrode Atom Probe | Michael K. Miller (u. a.) | Taschenbuch | xviii | Englisch | 2016 | Springer | EAN 9781489977908 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Condición: New. pp. 441.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe - a new state-of-the-art instrument - is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.

Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Condición: Brand New. reprint edition. 441 pages. 9.25x6.10x1.05 inches. In Stock.

Condición: new. Questo è un articolo print on demand.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe - a new state-of-the-art instrument - is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique. 444 pp. Englisch.

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materialswith atom probe tomography.Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation andfield ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. Afull description of the local electrode atom probe ¿ a new state-of-the-art instrument ¿ is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 444 pp. Englisch.

Condición: New. Print on Demand pp. 441.

Condición: New. PRINT ON DEMAND pp. 441.