Isbn: 9781461575689 - pattern recognition and machine learning: proceedings of the japan—u.s. seminar on the learning process in control systems, held in nagoya, japan august 18–20, 1970 (8 resultados)

ISBN
Refinar con la Búsqueda avanzada

Filtrar la búsqueda

  • Libros (8)

  • Nuevo (8)

a

Intervalo de precios personalizado (EUR)

a

  • Idioma: Inglés

    Editorial: Springer, 2012

    1461575680 / 9781461575689

    • Tapa blanda

    Librería: California Books, Miami, FL, Estados Unidos de AmericaCalifornia Books

    Vendedor de 4 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 148,86

     Gastos de envío gratis 
    Se envía dentro de Estados Unidos de America

    Cantidad disponible: Más de 20 disponibles

    Condición: New.

  • Idioma: Inglés

    Editorial: Springer, 2012

    1461575680 / 9781461575689

    • Tapa blanda

    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 140,97

    Envío por EUR 13,17 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: Más de 20 disponibles

    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Springer US, 2014

    1461575680 / 9781461575689

    • Tapa blanda

    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 184,07

    Envío por EUR 14,58 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: 2 disponibles

    Paperback. Condición: Brand New. reprint edition. 354 pages. 9.92x6.85x0.79 inches. In Stock.

  • Idioma: Inglés

    Editorial: Springer US, Springer New York, 2012

    1461575680 / 9781461575689

    • Tapa blanda

    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 180,92

    Envío por EUR 30,50 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains the Proceedings of the US-Japan Seminar on Learning Process in Control Systems. The seminar, held in Nagoya, Japan, from August 18 to 20, 1970, was sponsored by the US-Japan Cooperative Science Program, jointly supported by the National Science Foundation and the Japan Society for the Promotion of Science. The full texts of all the presented papers except two t are included. The papers cover a great variety of topics related to learning processes and systems, ranging from pattern recognition to systems identification, from learning control to biological modelling. In order to reflect the actual content of the book, the present title was selected. All the twenty-eight papers are roughly divided into two parts--Pattern Recognition and System Identification and Learning Process and Learning Control. It is sometimes quite obvious that some papers can be classified into either part. The choice in these cases was strictly the editor's in order to keep a certain balance between the two parts. During the past decade there has been a considerable growth of interest in problems of pattern recognition and machine learn ing. In designing an optimal pattern recognition or control system, if all the a priori information about the process under study is known and can be described deterministically, the optimal system is usually designed by deterministic optimization techniques.

  • Idioma: Inglés

    Editorial: Springer US Dez 2012, 2012

    1461575680 / 9781461575689

    • Tapa blanda
    • Impresión bajo demanda

    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 85,55

    Envío por EUR 23,00 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 2 disponibles

    Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains the Proceedings of the US-Japan Seminar on Learning Process in Control Systems. The seminar, held in Nagoya, Japan, from August 18 to 20, 1970, was sponsored by the US-Japan Cooperative Science Program, jointly supported by the National Science Foundation and the Japan Society for the Promotion of Science. The full texts of all the presented papers except two t are included. The papers cover a great variety of topics related to learning processes and systems, ranging from pattern recognition to systems identification, from learning control to biological modelling. In order to reflect the actual content of the book, the present title was selected. All the twenty-eight papers are roughly divided into two parts--Pattern Recognition and System Identification and Learning Process and Learning Control. It is sometimes quite obvious that some papers can be classified into either part. The choice in these cases was strictly the editor's in order to keep a certain balance between the two parts. During the past decade there has been a considerable growth of interest in problems of pattern recognition and machine learn ing. In designing an optimal pattern recognition or control system, if all the a priori information about the process under study is known and can be described deterministically, the optimal system is usually designed by deterministic optimization techniques. 356 pp. Englisch.

  • Idioma: Inglés

    Editorial: Springer, 2012

    1461575680 / 9781461575689

    • Tapa blanda
    • Impresión bajo demanda

    Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 102,25

    Envío por EUR 6,80 
    Se envía de Italia a Estados Unidos de America

    Cantidad disponible: Más de 20 disponibles

    Condición: new. Questo è un articolo print on demand.

  • Idioma: Inglés

    Editorial: Springer US, 2012

    1461575680 / 9781461575689

    • Tapa blanda
    • Impresión bajo demanda

    Librería: moluna, Greven, Alemaniamoluna

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 109,83

    Envío por EUR 48,99 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: Más de 20 disponibles

    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book contains the Proceedings of the US-Japan Seminar on Learning Process in Control Systems. The seminar, held in Nagoya, Japan, from August 18 to 20, 1970, was sponsored by the US-Japan Cooperative Science Program, jointly supported by the National S.

  • Idioma: Inglés

    Editorial: Springer US, Springer New York Dez 2012, 2012

    1461575680 / 9781461575689

    • Tapa blanda
    • Impresión bajo demanda

    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 128,39

    Envío por EUR 60,00 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book contains the Proceedings of the US-Japan Seminar on Learning Process in Control Systems. The seminar, held in Nagoya, Japan, from August 18 to 20, 1970, was sponsored by the US-Japan Cooperative Science Program, jointly supported by the National Science Foundation and the Japan Society for the Promotion of Science. The full texts of all the presented papers except two t are included. The papers cover a great variety of topics related to learning processes and systems, ranging from pattern recognition to systems identification, from learning control to biological modelling. In order to reflect the actual content of the book, the present title was selected. All the twenty-eight papers are roughly divided into two parts--Pattern Recognition and System Identification and Learning Process and Learning Control. It is sometimes quite obvious that some papers can be classified into either part. The choice in these cases was strictly the editor's in order to keep a certain balance between the two parts. During the past decade there has been a considerable growth of interest in problems of pattern recognition and machine learn ing. In designing an optimal pattern recognition or control system, if all the a priori information about the process under study is known and can be described deterministically, the optimal system is usually designed by deterministic optimization techniques.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 356 pp. Englisch.