9781447124696 - interfacial compatibility in microelectronics: moving away from the trial and error approach (microsystems) de paulasto-kröckel, mervi; laurila, tomi; vuorinen, vesa (10 resultados)
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)
Laurila, Tomi; Vuorinen, Vesa; Paulasto-Kröckel, Mervi; Turunen, Markus; Mattila, Toni T.; Kivilahti, Jorma
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their inte…ractions in the system. In this difficult task, the 'traditional' method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced.In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes: solutions to several common reliability issues in microsystem technology, methods to understand and predict failure mechanisms at interfaces between dissimilar materials and an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA.Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.
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Hardcover. Condición: Brand New. 2012 edition. 226 pages. 9.20x6.10x0.70 inches. In Stock.
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)
Laurila, Tomi, Vuorinen, Vesa, Paulasto-Kröckel, Mervi, Turu
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Interfacial Compatibility in Microelectronics
Laurila, Tomi; Vuorinen, Vesa; Paulasto-Kröckel, Mervi; Turunen, Markus; Mattila, Toni T.; Kivilahti, Jorma
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of material…s and their interactions in the system. In this difficult task, the 'traditional' method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced.In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes: solutions to several common reliability issues in microsystem technology, methods to understand and predict failure mechanisms at interfaces between dissimilar materials and an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA.Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike. 228 pp. Englisch.
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Interfacial Compatibility in Microelectronics
Tomi Laurila|Vesa Vuorinen|Mervi Paulasto-Kröckel|Markus Turunen|Toni T. Mattila|Jorma Kivilahti
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides solutions to several common reliability issues in microsystem packagingTeaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materialsCombines thermodynamic-…diffusion kinetic model.
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Librería: preigu, Osnabrück, Alemaniapreigu
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Buch. Condición: Neu. Interfacial Compatibility in Microelectronics | Moving Away from the Trial and Error Approach | Tomi Laurila (u. a.) | Buch | Microsystems | x | Englisch | 2012 | Springer | EAN 9781447124696 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann…[at]springer[dot]com | Anbieter: preigu Print on Demand.
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
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Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials an…d their interactions in the system. In this difficult task, the ¿traditional¿ method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced.In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes:solutions to several common reliability issues in microsystem technologymethods to understand and predict failure mechanisms at interfaces between dissimilar materials andan approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA.Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 228 pp. Englisch.
