ISBN: 9781402076527 - verification by error modeling: using testing techniques in hardware verification: 25 (frontiers in electronic testing, 25) (17 resultados)

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  • Idioma: Inglés

    Editorial: Springer, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: Peak Pearl LLC, Holly Springs, NC, Estados Unidos de AmericaPeak Pearl LLC

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    EUR 82,58

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    Hardcover. Condición: As New. Like new, never been used.

  • Idioma: Inglés

    Editorial: Kluwer Academic Publishers, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: World of Books (was SecondSale), Montgomery, IL, Estados Unidos de AmericaWorld of Books (was SecondSale)

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    EUR 128,98

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    Hardback. Condición: Good. 1. DESIGN FLOW Integrated circuit (IC) complexity is steadily increasing. ICs incorporating hundreds of millions of transistors, mega-bit memories, complicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be ?imminently doable? by Intel fellow J. Crawford at Microprocessor Forum in October 2002 [40]. Obviously, designing such complex circuits poses real challenges to engineers. Certainly, no relief comes from the competitive marketplace, with increasing demands for a very narrow window of time (time-to-market) in engineering a ready product. Therefore, a systematic and well-structured approach to designing ICs is a must. Although there are no widely adhered standards for a design flow, most companies have their own established practices, which they follow closely for in-house design processes. In general, however, a typical product cycle includes few milestones. An idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefully specified. Ideally, these parameters would not change during the design process. In practice, initial phases of preparing a design specification are susceptible to potential errors, as it is very difficult to grasp all the details in a complex design.…

  • Idioma: Inglés

    Editorial: Springer, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    EUR 126,56

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    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: Kluwer Academic Publishers, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: World of Books Inc, Montgomery, IL, Estados Unidos de AmericaWorld of Books Inc

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    EUR 135,43

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    Hardback. Condición: Good. 1. DESIGN FLOW Integrated circuit (IC) complexity is steadily increasing. ICs incorporating hundreds of millions of transistors, mega-bit memories, complicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be ?imminently doable? by Intel fellow J. Crawford at Microprocessor Forum in October 2002 [40]. Obviously, designing such complex circuits poses real challenges to engineers. Certainly, no relief comes from the competitive marketplace, with increasing demands for a very narrow window of time (time-to-market) in engineering a ready product. Therefore, a systematic and well-structured approach to designing ICs is a must. Although there are no widely adhered standards for a design flow, most companies have their own established practices, which they follow closely for in-house design processes. In general, however, a typical product cycle includes few milestones. An idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefully specified. Ideally, these parameters would not change during the design process. In practice, initial phases of preparing a design specification are susceptible to potential errors, as it is very difficult to grasp all the details in a complex design.…

  • Idioma: Inglés

    Editorial: Springer, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK

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    EUR 124,17

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  • Idioma: Inglés

    Editorial: Springer, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    EUR 130,92

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    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Kluwer Academic Publishers, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.

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    EUR 133,68

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    Condición: New. Presents the basis for reusing the test vector generation and simulation for the purpose of implementation verification, to result in a significant timesaving. This book brings the results in the direction of merging manufacturing test vector generation and verification. Series: Frontiers in Electronic Testing. Num Pages: 231 pages, biography. BIC Classification: TJFM1. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 509. . 2003. Hardback. . . . . …

  • Idioma: Inglés

    Editorial: Springer, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    EUR 145,93

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    Condición: New.

  • Idioma: Inglés

    Editorial: Springer, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle

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    EUR 159,26

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    Condición: New. pp. 236.

  • Idioma: Inglés

    Editorial: Springer US, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    EUR 124,85

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    Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - 1. DESIGN FLOW Integrated circuit (IC) complexity is steadily increasing. ICs incorporating hundreds of millions of transistors, mega-bit memories, complicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be 'imminently doable' by Intel fellow J. Crawford at Microprocessor Forum in October 2002 [40]. Obviously, designing such complex circuits poses real challenges to engineers. Certainly, no relief comes from the competitive marketplace, with increasing demands for a very narrow window of time (time-to-market) in engineering a ready product. Therefore, a systematic and well-structured approach to designing ICs is a must. Although there are no widely adhered standards for a design flow, most companies have their own established practices, which they follow closely for in-house design processes. In general, however, a typical product cycle includes few milestones. An idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefully specified. Ideally, these parameters would not change during the design process. In practice, initial phases of preparing a design specification are susceptible to potential errors, as it is very difficult to grasp all the details in a complex design. …

  • Idioma: Inglés

    Editorial: Kluwer Academic Publishers, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore

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    EUR 171,97

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    Cantidad disponible: 15 disponibles

    Condición: New. Presents the basis for reusing the test vector generation and simulation for the purpose of implementation verification, to result in a significant timesaving. This book brings the results in the direction of merging manufacturing test vector generation and verification. Series: Frontiers in Electronic Testing. Num Pages: 231 pages, biography. BIC Classification: TJFM1. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 509. . 2003. Hardback. . . . . Books ship from the US and Ireland. …

  • Idioma: Inglés

    Editorial: Springer, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK

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    EUR 191,45

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    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: Springer US, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    EUR 92,27

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    Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. aThis book presents the basis for reusing the test vector generation and simulation for the purpose of implementation verification, to result in a significant timesaving. It brings the results in the direction of merging manufacturing test vector gen.…

  • Idioma: Inglés

    Editorial: Springer US, Springer US Nov 2003, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -1. DESIGN FLOW Integrated circuit (IC) complexity is steadily increasing. ICs incorporating hundreds of millions of transistors, mega-bit memories, complicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be ¿imminently doable¿ by Intel fellow J. Crawford at Microprocessor Forum in October 2002 [40]. Obviously, designing such complex circuits poses real challenges to engineers. Certainly, no relief comes from the competitive marketplace, with increasing demands for a very narrow window of time (time-to-market) in engineering a ready product. Therefore, a systematic and well-structured approach to designing ICs is a must. Although there are no widely adhered standards for a design flow, most companies have their own established practices, which they follow closely for in-house design processes. In general, however, a typical product cycle includes few milestones. An idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefully specified. Ideally, these parameters would not change during the design process. In practice, initial phases of preparing a design specification are susceptible to potential errors, as it is very difficult to grasp all the details in a complex design.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 236 pp. Englisch. …

  • Idioma: Inglés

    Editorial: Springer, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books

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    EUR 166,14

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    Condición: New. Print on Demand pp. 236 Illus.

  • Idioma: Inglés

    Editorial: Springer, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

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    EUR 166,44

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    Condición: New. PRINT ON DEMAND pp. 236.

  • Idioma: Inglés

    Editorial: Springer US Nov 2003, 2003

    1402076525 / 9781402076527

    Serie: Libro 4 de 40 - Frontiers in Electronic Testing

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    EUR 160,49

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    Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents the basis for reusing the test vector generation and simulation for the purpose of implementation verification, to result in a significant timesaving. It brings the results in the direction of merging manufacturing test vector generation and verification. 236 pp. Englisch.…