Isbn: 9781402027857 - embedded processor-based self-test: 28 (frontiers in electronic testing, 28) (12 resultados)

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  • Idioma: Inglés

    Editorial: Springer, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: BennettBooksLtd, Los Angeles, CA, Estados Unidos de AmericaBennettBooksLtd

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    EUR 207,12

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    hardcover. Condición: New. In shrink wrap. Looks like an interesting title.

  • Idioma: Inglés

    Editorial: Springer, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle

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    EUR 216,68

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    Condición: New. pp. 236.

  • Idioma: Inglés

    Editorial: Springer, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    EUR 208,85

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    Cantidad disponible: Más de 20 disponibles

    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Kluwer Academic Pub, 2005

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    EUR 238,90

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    Hardcover. Condición: Brand New. 1st edition. 216 pages. 9.50x6.50x0.50 inches. In Stock.

  • Idioma: Inglés

    Editorial: Springer, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books

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    Condición: Usado - Como Nuevo

    EUR 257,49

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    Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Idioma: Inglés

    Editorial: Humana Dez 2004, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures. 236 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer US, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: moluna, Greven, Alemaniamoluna

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    Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Sets the framework for comparisons among different SBST methodologies by discussing key requirementsPresents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.…

  • Idioma: Inglés

    Editorial: Humana, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    EUR 174,36

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    Buch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.…

  • Idioma: Inglés

    Editorial: Springer US, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: preigu, Osnabrück, Alemaniapreigu

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    Buch. Condición: Neu. Embedded Processor-Based Self-Test | Dimitris Gizopoulos (u. a.) | Buch | Frontiers in Electronic Testing | xv | Englisch | 2004 | Springer US | EAN 9781402027857 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. …

  • Idioma: Inglés

    Editorial: Springer US, Springer US Dez 2004, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

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    EUR 160,49

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    Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit¿s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 236 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books

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    EUR 226,26

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    Condición: New. Print on Demand pp. 236 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

  • Idioma: Inglés

    Editorial: Springer, 2004

    1402027850 / 9781402027857

    Serie: Libro 34 de 40 - Frontiers in Electronic Testing

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    Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

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    EUR 227,12

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    Condición: New. PRINT ON DEMAND pp. 236.