9780792381327 - on-line testing for vlsi: 11 (frontiers in electronic testing, 11) (13 resultados)
Idioma: Inglés
Editorial: Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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Condición: New. In.
Idioma: Inglés
Editorial: Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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EUR 146,75
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Condición: New. pp. 168.
Idioma: Inglés
Editorial: Kluwer Academic Publishers 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 134,16
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Condición: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicola…idis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . .
Idioma: Inglés
Editorial: Kluwer Academic Publishers 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore
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EUR 169,24
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Condición: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicola…idis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . . Books ship from the US and Ireland.
Idioma: Inglés
Editorial: Springer, Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 114,36
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concur…rent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Idioma: Inglés
Editorial: Springer US 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Buchpark, Trebbin, , AlemaniaBuchpark
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Condición: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurren…t error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Idioma: Inglés
Editorial: Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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EUR 166,15
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Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Idioma: Inglés
Editorial: Springer US 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: moluna, Greven, , Alemaniamoluna
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scop…e, on-line testing includes the design.
Idioma: Inglés
Editorial: Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Majestic Books, Hounslow, , Reino UnidoMajestic Books
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Condición: New. Print on Demand pp. 168 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.
Idioma: Inglés
Editorial: Springer US Apr 1998 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , AlemaniaBuchWeltWeit Ludwig Meier e.K.
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the…design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. 168 pp. Englisch.
Idioma: Inglés
Editorial: Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 152,89
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Condición: New. PRINT ON DEMAND pp. 168.
Más imágenesIdioma: Inglés
Editorial: Springer 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: preigu, Osnabrück, Alemaniapreigu
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Buch. Condición: Neu. On-Line Testing for VLSI | Michael Nicolaidis (u. a.) | Buch | iv | Englisch | 1998 | Springer | EAN 9780792381327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Idioma: Inglés
Editorial: Springer, Springer Apr 1998 1998
Serie: Frontiers in Electronic Testing, Libro 33 de 40. Libro 33 de 40 - Frontiers in Electronic Testing
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
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EUR 106,99
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Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the desi…gn of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 168 pp. Englisch.
