Isbn: 9780792380795 - a unified approach for timing verification and delay fault testing (18 resultados)

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  • Idioma: Inglés

    Editorial: Kluwer Academic Publishers, Dordrecht, Holland, 1997

    0792380797 / 9780792380795

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    Librería: PsychoBabel & Skoob Books, Didcot, Reino UnidoPsychoBabel & Skoob Books

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    hardcover. Condición: Very Good. No Dust Jacket. First Edition. Hardback in very good condition. Printed boards, a little scuffed; previous owner's name on FEP, no jacket as issued; contents clean, sound, bright. TPW. Used.

  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books

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    Hardcover. Condición: Like New. Like NewLIKE NEW. book.

  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    EUR 116,04

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  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: BennettBooksLtd, Los Angeles, CA, Estados Unidos de AmericaBennettBooksLtd

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    EUR 112,13

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    hardcover. Condición: New. In shrink wrap. Looks like an interesting title.

  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    EUR 125,43

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    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK

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    EUR 124,10

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    Condición: New.

  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    EUR 128,71

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    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Springer US, 1997

    0792380797 / 9780792380795

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    Librería: Buchpark, Trebbin, AlemaniaBuchpark

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    EUR 35,62

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    Condición: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.…

  • Idioma: Inglés

    Editorial: Kluwer Academic Publishers, 1997

    0792380797 / 9780792380795

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    Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.

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    EUR 132,60

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    Condición: New. This text applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. Num Pages: 155 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 11. Weight in Grams: 426. . 1997. Hardback. . . . .…

  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK

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    EUR 130,22

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    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    Condición: Nuevo

    EUR 117,28

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    Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.…

  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle

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    Condición: Nuevo

    EUR 155,60

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    Condición: New. pp. 176.

  • Idioma: Inglés

    Editorial: Kluwer Academic Publishers, 1997

    0792380797 / 9780792380795

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    Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore

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    Condición: Nuevo

    EUR 169,26

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    Condición: New. This text applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. Num Pages: 155 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 11. Weight in Grams: 426. . 1997. Hardback. . . . . Books ship from the US and Ireland.…

  • Idioma: Inglés

    Editorial: Springer US, 1997

    0792380797 / 9780792380795

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    Librería: moluna, Greven, Alemaniamoluna

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    EUR 92,27

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    Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in .…

  • Idioma: Inglés

    Editorial: Springer US Nov 1997, 1997

    0792380797 / 9780792380795

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    EUR 139,09

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    Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing. 176 pp. Englisch. …

  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books

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    EUR 162,37

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    Condición: New. Print on Demand pp. 176 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

  • Idioma: Inglés

    Editorial: Springer US, Springer US Nov 1997, 1997

    0792380797 / 9780792380795

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    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

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    EUR 106,99

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    Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts.A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation.A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers.A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model.A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits.The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 176 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer, 1997

    0792380797 / 9780792380795

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    Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

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    EUR 162,16

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    Condición: New. PRINT ON DEMAND pp. 176.