Isbn: 9780471784067 - manufacturing and process control (ieee press) (22 resultados)

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  • Idioma: Inglés

    Editorial: Wiley-IEEE Press, 2006

    0471784060 / 9780471784067

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    Librería: Goodwill of Silicon Valley, SAN JOSE, CA, Estados Unidos de AmericaGoodwill of Silicon Valley

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    EUR 87,63

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    Condición: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.

  • Idioma: Inglés

    Editorial: Wiley-IEEE Press, 2006

    0471784060 / 9780471784067

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    EUR 111,14

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    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: Wiley, 2006

    0471784060 / 9780471784067

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    Librería: PBShop.store UK, Fairford, GLOS, Reino UnidoPBShop.store UK

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    Condición: Nuevo

    EUR 114,64

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    Cantidad disponible: 15 disponibles

    HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

  • Idioma: Inglés

    Editorial: Wiley-IEEE Press, 2006

    0471784060 / 9780471784067

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    Condición: Nuevo

    EUR 122,75

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    Condición: New.

  • Idioma: Inglés

    Editorial: Wiley-IEEE Press, 2006

    0471784060 / 9780471784067

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    Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condición: Nuevo

    EUR 113,21

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    Condición: new.

  • Idioma: Inglés

    Editorial: Wiley-IEEE Press, 2006

    0471784060 / 9780471784067

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    Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK

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    EUR 114,63

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    Condición: New.

  • Idioma: Inglés

    Editorial: Wiley-IEEE Press, 2006

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    Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK

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    Condición: Usado - Como Nuevo

    EUR 124,75

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    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: Wiley-IEEE Press, 2006

    0471784060 / 9780471784067

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    Librería: California Books, Miami, FL, Estados Unidos de AmericaCalifornia Books

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    Condición: Nuevo

    EUR 143,12

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    Condición: New.

  • Idioma: Inglés

    Editorial: Wiley-IEEE Press, 2006

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    Condición: Nuevo

    EUR 134,16

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    Condición: New. In English.

  • Idioma: Inglés

    Editorial: John Wiley & Sons Inc, 2006

    0471784060 / 9780471784067

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    Librería: THE SAINT BOOKSTORE, Southport, Reino UnidoTHE SAINT BOOKSTORE

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    Condición: Nuevo

    EUR 134,31

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    Hardback. Condición: New. New copy - Usually dispatched within 4 working days.

  • Idioma: Inglés

    Editorial: John Wiley and Sons Inc, US, 2006

    0471784060 / 9780471784067

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    Librería: Rarewaves.com USA, London, LONDO, Reino UnidoRarewaves.com USA

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    Condición: Nuevo

    EUR 158,63

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    Hardback. Condición: New. A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and management of overall manufacturing systems * Chapters include case studies, sample problems, and suggested exercises * Instructor support includes electronic copies of the figures and an instructor's manual Graduate-level students and industrial practitioners will benefit from the detailed exami?nation of how electronic materials and supplies are converted into finished integrated circuits and electronic products in a high-volume manufacturing environment. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.…

  • Idioma: Inglés

    Editorial: Wiley-IEEE Press, 2006

    0471784060 / 9780471784067

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    Librería: BennettBooksLtd, Los Angeles, CA, Estados Unidos de AmericaBennettBooksLtd

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    Condición: Nuevo

    EUR 156,84

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    Cantidad disponible: 1 disponible

    hardcover. Condición: New. In shrink wrap. Looks like an interesting title.

  • Idioma: Inglés

    Editorial: John Wiley and Sons Ltd, 2006

    0471784060 / 9780471784067

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    • Primera edición

    Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.

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    EUR 150,78

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    Condición: New. Fundamentals of Semiconductor Manufacturing and Process Control examines in detail the methodology by which electronic materials and supplies are converted into finished integrated circuits, and electronic products in a high-volume manufacturing environment. Num Pages: 488 pages, Illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 166 x 25. Weight in Grams: 776. . 2006. 1st Edition. Hardcover. . . . . …

  • Idioma: Inglés

    Editorial: John Wiley & Sons, 2006

    0471784060 / 9780471784067

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    Librería: moluna, Greven, Alemaniamoluna

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    EUR 134,10

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    Condición: New. GARY S. MAY, PhD, is Professor in the School of Electrical and Computer Engineering at the Georgia Institute of Technology. Dr. May is a Fellow of the IEEE and Senior Member of the Society of Manufacturing Engineers. He has published more than 150 articles .

  • Idioma: Inglés

    Editorial: IEEE, 2006

    0471784060 / 9780471784067

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    Condición: Nuevo

    EUR 178,40

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    Cantidad disponible: 2 disponibles

    Hardcover. Condición: Brand New. 463 pages. 9.50x6.50x1.25 inches. In Stock.

  • Idioma: Inglés

    Editorial: John Wiley and Sons Ltd, 2006

    0471784060 / 9780471784067

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    Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore

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    Condición: Nuevo

    EUR 192,96

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    Condición: New. Fundamentals of Semiconductor Manufacturing and Process Control examines in detail the methodology by which electronic materials and supplies are converted into finished integrated circuits, and electronic products in a high-volume manufacturing environment. Num Pages: 488 pages, Illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 166 x 25. Weight in Grams: 776. . 2006. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland. …

  • Idioma: Inglés

    Editorial: John Wiley & Sons Mai 2006, 2006

    0471784060 / 9780471784067

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    Condición: Nuevo

    EUR 171,08

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    Cantidad disponible: 2 disponibles

    Buch. Condición: Neu. Neuware - A practical guide to semiconductor manufacturing from process control to yield modeling and experimental designFundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts.Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields.The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis.Critical coverage includes the following:\* Combines process control and semiconductor manufacturing\* Unique treatment of system and software technology and management of overall manufacturing systems\* Chapters include case studies, sample problems, and suggested exercises\* Instructor support includes electronic copies of the figures and an instructor's manualGraduate-level students and industrial practitioners will benefit from the detailed exami nation of how electronic materials and supplies are converted into finished integrated circuits and electronic products in a high-volume manufacturing environment.…

  • Idioma: Inglés

    Editorial: John Wiley and Sons Inc, US, 2006

    0471784060 / 9780471784067

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    Librería: Rarewaves.com UK, London, Reino UnidoRarewaves.com UK

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    Condición: Nuevo

    EUR 155,03

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    Hardback. Condición: New. A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and management of overall manufacturing systems * Chapters include case studies, sample problems, and suggested exercises * Instructor support includes electronic copies of the figures and an instructor's manual Graduate-level students and industrial practitioners will benefit from the detailed exami?nation of how electronic materials and supplies are converted into finished integrated circuits and electronic products in a high-volume manufacturing environment. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.…

  • Idioma: Inglés

    Editorial: Wiley-IEEE Press, 2006

    0471784060 / 9780471784067

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    Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books

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    Condición: Usado - Como Nuevo

    EUR 270,13

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    Cantidad disponible: 1 disponible

    Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Idioma: Inglés

    Editorial: John Wiley & Sons Inc, 2006

    0471784060 / 9780471784067

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    Librería: THE SAINT BOOKSTORE, Southport, Reino UnidoTHE SAINT BOOKSTORE

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    EUR 143,86

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    Hardback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 856.

  • Idioma: Inglés

    Editorial: IEEE, 2006

    0471784060 / 9780471784067

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    EUR 160,47

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    Hardcover. Condición: Brand New. 463 pages. 9.50x6.50x1.25 inches. In Stock. This item is printed on demand.

  • Idioma: Inglés

    Editorial: John Wiley & Sons Inc, Chichester, 2006

    0471784060 / 9780471784067

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    Librería: CitiRetail, Stevenage, Reino UnidoCitiRetail

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    EUR 130,85

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    Hardcover. Condición: new. Hardcover. A practical guide to semiconductor manufacturing from process control to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and management of overall manufacturing systems * Chapters include case studies, sample problems, and suggested exercises * Instructor support includes electronic copies of the figures and an instructor's manual Graduate-level students and industrial practitioners will benefit from the detailed exami?nation of how electronic materials and supplies are converted into finished integrated circuits and electronic products in a high-volume manufacturing environment. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. Fundamentals of Semiconductor Manufacturing and Process Control examines in detail the methodology by which electronic materials and supplies are converted into finished integrated circuits, and electronic products in a high-volume manufacturing environment. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. …