Vashchenko vladislav a (40 resultados)

Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

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Taschenbuch. Condición: Neu. System Level ESD Protection | Vladislav Vashchenko (u. a.) | Taschenbuch | xviii | Englisch | 2016 | Springer | EAN 9783319348926 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Condición: New. pp. 480.

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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the beginning of semiconductor era in microelectronics the methodology of reliability assessment became a well established area. In most cases the reliability assessment involves statistical methods for safe operating area and long term re- ability parameters at the development of semiconductor processes, components and systems. At the same time in case of catastrophic failures at any development phase the major practical method is failure analysis (FA). However FA is mainly dealing with detection of consequences of some irreversible event that already happened. This book is focused on the most important and the less summarized reliability aspects. Among them: catastrophic failures, impact of local structural inhomo- neities, major principles of physical limitation of safe-operating area (SOA), physical mechanisms of the current instability, filamentation and conductivity modulation in particular device types and architectures. Specifically, the similar principles and regularities are discussed for elect- static discharge (ESD) protection devices, treating them as a particular case of pulsed power devices. Thus both the most intriguing applications and reliability problems in case of the discrete and the integrated components are covered in this book.…

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the beginning of semiconductor era in microelectronics the methodology of reliability assessment became a well established area. In most cases the reliability assessment involves statistical methods for safe operating area and long term re- ability parameters at the development of semiconductor processes, components and systems. At the same time in case of catastrophic failures at any development phase the major practical method is failure analysis (FA). However FA is mainly dealing with detection of consequences of some irreversible event that already happened. This book is focused on the most important and the less summarized reliability aspects. Among them: catastrophic failures, impact of local structural inhomo- neities, major principles of physical limitation of safe-operating area (SOA), physical mechanisms of the current instability, filamentation and conductivity modulation in particular device types and architectures. Specifically, the similar principles and regularities are discussed for elect- static discharge (ESD) protection devices, treating them as a particular case of pulsed power devices. Thus both the most intriguing applications and reliability problems in case of the discrete and the integrated components are covered in this book.…

Taschenbuch. Condición: Neu. Physical Limitations of Semiconductor Devices | Vladislav A. Vashchenko (u. a.) | Taschenbuch | xiii | Englisch | 2010 | Springer | EAN 9781441945051 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Condición: New. In English.

Condición: New. In English.

Condición: New.

Condición: New. pp. 480.

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Taschenbuch. Condición: Neu. ESD Design for Analog Circuits | Vladislav A. Vashchenko (u. a.) | Taschenbuch | xx | Englisch | 2014 | Springer | EAN 9781489997579 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering.

Condición: Sehr gut. Zustand: Sehr gut | Seiten: 459 | Sprache: Englisch | Produktart: Bücher | ESD Design for Analog Circuits covers many challenging topics related to analog circuit design for both ESD device and ESD circuits at the network level. The chapters cover technical material on seven different hierarchical levels starting from elementary semiconductor structures, ESD device and clamp levels up to ESD protection network design followed by complex case studies for analog circuit design examples. Included is an extensive discussion of ESD design aspects for analog design for signal path products covering both major principles and specific case studies for DC-DC buck/boost converters, level shifters, digital-analog converters, high speed and precision power amplifiers, interface applications and system level protection.At the same time, the authors introduce a novel companion study tool for ESD protection solutions. Quick-start learning is combined with in-depth understanding for the whole spectrum of cross-disciplinary knowledge needed for excelling in the ESD field. The material combines textbook material with optional numerical simulation experience. Instructions for obtaining the simulation examples and trial version of DECIMMTM software can be found on the book's companion website [LINK ENTFERNT] The simulation examples prepared by the authors support the specific examples discussed across the book chapters.ESD Design for Analog Circuits is a useful reference for device engineers and circuit designers addressing Analog IC Design problems.…

Condición: New.

Condición: New. In English.

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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering.

Condición: New. pp. 480.

paperback. Condición: New. Language:Chinese.Paperback. Pub Date: 2019-03-01 Pages: 255 Publisher: Mechanical Industry Press This book covers system-level electrostatic discharge (ESD) protection design for critical aspects of analog integrated circuits and systems. This book focuses on embedded semiconductor integrated circuits (ICs). system-on-chip components. and integrated circuit system-level protection designs. This book is based on the ESD protection of IC systems.…

Condición: new. Questo è un articolo print on demand.

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Since the beginning of semiconductor era in microelectronics the methodology of reliability assessment became a well established area. In most cases the reliability assessment involves statistical methods for safe operating area and long term re- ability parameters at the development of semiconductor processes, components and systems. At the same time in case of catastrophic failures at any development phase the major practical method is failure analysis (FA). However FA is mainly dealing with detection of consequences of some irreversible event that already happened. This book is focused on the most important and the less summarized reliability aspects. Among them: catastrophic failures, impact of local structural inhomo- neities, major principles of physical limitation of safe-operating area (SOA), physical mechanisms of the current instability, filamentation and conductivity modulation in particular device types and architectures. Specifically, the similar principles and regularities are discussed for elect- static discharge (ESD) protection devices, treating them as a particular case of pulsed power devices. Thus both the most intriguing applications and reliability problems in case of the discrete and the integrated components are covered in this book. 330 pp. Englisch.…

Condición: new. Questo è un articolo print on demand.

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides the description and translation of cross-disciplinary phenomena for reliability assurance including circuit design, ESD design and TCAD simulationApplies directly to the area of ESD protection designExplains complex physical descri.…

Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides the description and translation of cross-disciplinary phenomena for reliability assurance including circuit design, ESD design and TCAD simulationApplies directly to the area of ESD protection designExplains complex physical descri.…

Condición: New. pp. 480 This item is printed on demand.