Tompkins harland (72 resultados)

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Paperback or Softback. Condición: New. A User's Guide to Ellipsometry. Book.

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Paperback. Condición: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

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Paperback. Condición: Brand New. 260 pages. 8.25x5.25x0.50 inches. In Stock.

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Paperback or Softback. Condición: New. Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization. Book.

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Condición: New. pp. xii + 260 Illus.

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Paperback. Condición: New. Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.…

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Condición: New.

Paperback. Condición: New. Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.…

Condición: New.

Taschenbuch. Condición: Neu. Neuware - This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 14 case studies illustrate concepts and applications. Three appendices provide helpful references. 1993 edition.…

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Paperback. Condición: Brand New. 178 pages. 9.00x6.00x0.50 inches. In Stock.

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Condición: New. Inhaltsverzeichnisrnrn1. Theoretical Aspectsn2. Instrumentationn3. Using Optical Parameters to Determine Material Propertiesn4. Determining Optical Parameters for Inaccessible Substrates and Unknown Filmsn5. Extremely Thin Filmsn6. The Spe.

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paperback. Condición: New. In shrink wrap. Looks like an interesting title.