Stephan eggersglüß (41 resultados)

Condición: New.

Condición: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Condición: New. In English.

Condición: New. In English.

Condición: New.

Condición: New.

Condición: New. In English.

Condición: New. In English.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.…

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.…

Condición: New. pp. 212.

Hardcover. Condición: Brand New. 193 pages. 9.50x6.50x0.75 inches. In Stock.

Taschenbuch. Condición: Neu. High Quality Test Pattern Generation and Boolean Satisfiability | Stephan Eggersglüß (u. a.) | Taschenbuch | xviii | Englisch | 2014 | Springer | EAN 9781489988478 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Condición: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed in the last 30 years. But due to the ever increasing design complexity, new techniques have to be developed that can cope with today's circuits. While classical approaches are based on backtracking on the circuit structure, several approaches based on "Boolean Satisfiability" (SAT) have been proposed since the early 80s. In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work. …

Paperback. Condición: Like New. Like New. book.

Condición: As New. Unread book in perfect condition.

Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condición: As New. Unread book in perfect condition.

Condición: As New. Unread book in perfect condition.

Condición: New.

Paperback. Condición: New. Eingebettete Systeme übernehmen zentrale Steueraufgaben im täglichen Leben. In der Energieversorgung oder im Transportwesen würde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlässt sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstüchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.…

Condición: As New. Unread book in perfect condition.

Condición: New.

Condición: New. In German.

Condición: As New. Unread book in perfect condition.

Paperback. Condición: Brand New. 238 pages. German language. 9.45x6.69x0.55 inches. In Stock.

Paperback. Condición: New. Eingebettete Systeme übernehmen zentrale Steueraufgaben im täglichen Leben. In der Energieversorgung oder im Transportwesen würde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlässt sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstüchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.…

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Embedded systems are assuming key control functions in everyday life. Systemic failure in the energy supply or the transport sector could lead to fatal consequences. Users place great reliance on the error-free function of such systems. Guaranteeing the functional capability of digital circuits is the goal of testing - and this aim must be achieved at low cost, since every chip has to be tested separately after production.; Eingebettete Systeme übernehmen zentrale Steueraufgaben im täglichen Leben. In der Energieversorgung oder im Transportwesen würde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlässt sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstüchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.…

Condición: new. Questo è un articolo print on demand.