Idioma: Inglés
Publicado por Kluwer Academic Publishers, 2004
ISBN 10: 1402021690 ISBN 13: 9781402021695
Librería: Optimon Books, Gravesend, KENT, Reino Unido
EUR 43,47
Cantidad disponible: 1 disponibles
Añadir al carritoPaperback. Condición: Good. THERE ARE NO TARIFFS OR CUSTOMS DUTIES ON BOOKS. A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future. Proceedings of a workshop on the topic in August 2003 and published in the following year. Softback book in good condition with sound binding and unmarked pages.
Librería: Books Puddle, New York, NY, Estados Unidos de America
EUR 113,31
Cantidad disponible: 1 disponibles
Añadir al carritoCondición: New. pp. 380.
Librería: Majestic Books, Hounslow, Reino Unido
EUR 114,96
Cantidad disponible: 1 disponibles
Añadir al carritoCondición: New. pp. 380 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Librería: Biblios, Frankfurt am main, HESSE, Alemania
EUR 117,51
Cantidad disponible: 1 disponibles
Añadir al carritoCondición: New. pp. 380.
Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 314,91
Cantidad disponible: Más de 20 disponibles
Añadir al carritoCondición: New. In.
Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 314,91
Cantidad disponible: Más de 20 disponibles
Añadir al carritoCondición: New. In.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 336,43
Cantidad disponible: 15 disponibles
Añadir al carritoCondición: New.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 336,45
Cantidad disponible: 15 disponibles
Añadir al carritoCondición: New.
Librería: Mispah books, Redhill, SURRE, Reino Unido
EUR 347,86
Cantidad disponible: 1 disponibles
Añadir al carritoPaperback. Condición: Like New. Like New. book.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 386,11
Cantidad disponible: 15 disponibles
Añadir al carritoCondición: As New. Unread book in perfect condition.
Librería: Mispah books, Redhill, SURRE, Reino Unido
EUR 404,63
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 444,59
Cantidad disponible: 15 disponibles
Añadir al carritoCondición: As New. Unread book in perfect condition.
Idioma: Inglés
Publicado por Springer Nature B.V. Jul 2004, 2004
ISBN 10: 1402021682 ISBN 13: 9781402021688
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 474,63
Cantidad disponible: 2 disponibles
Añadir al carritoBuch. Condición: Neu. Neuware - A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.