Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices: 151 (NATO Science Series II: Mathematics, Physics and Chemistry) - Tapa blanda
Sinopsis
A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.
The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.
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A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.
The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.
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Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
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Springer Netherlands Jul 2004, 2004
ISBN 10: 1402021690
ISBN 13: 9781402021695
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future. 380 pp. Englisch. Nº de ref. del artículo: 9781402021695
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Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices (NATO Science Series II: Mathematics, Physics and Chemistry, 151)
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Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
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Springer Netherland, 2004
ISBN 10: 1402021690
ISBN 13: 9781402021695
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Taschenbuch. Condición: Neu. Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices | Michael Levinshtein (u. a.) | Taschenbuch | ix | Englisch | 2004 | Springer Netherland | EAN 9781402021695 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Nº de ref. del artículo: 102161697
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