Ronald g driggers (59 resultados)

hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Condición: new.

Condición: very_good. Fast Free Shipping â" Very Good condition book with a firm cover and clean pages. Shows normal use and some light wear or limited notes markings. A solid, nice copy to enjoy.

Condición: very_good.

Paperback. Condición: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Condición: good. The item shows wear from consistent use, but it remains in good condition and works perfectly. All pages and cover are intact including the dust cover, if applicable . Spine may show signs of wear. Pages may include limited notes and highlighting. May NOT include discs, access code or other supplemental materials.…

hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Condición: acceptable. Fairly worn, but readable and intact. If applicable: Dust jacket, disc or access code may not be included.

Tapa Blanda. Condición: Bien. Colección 'SPIE Tutorial Texts in Optical Engineering'. Rústica. Ilustrado.9780819434890. SPIE Publications. Estados Unidos. 2000. 25x18 centímetros. 176 páginas. Tapa blanda. Estado=Bien. Inglés.

Hardcover. Condición: New. SHRINK-WRAPPED: US SELLER SHIPS FAST FROM USA.

hardcover. Condición: Very Good. Very Good- hardcover. Cover has minor wear. Gently read With no markings in text.

Paperback. Condición: Fair. Pap/Cdr. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.

Paperback. Condición: New. Advancing technology in detector arrays, flat panel displays, and digital image processing provides new opportunities to expand imaging applications and enhance system performance. Technical managers and design engineers are faced with evaluating the cost, weight, and performance of an ever-expanding selection of technology options. This tutorial text provides the theory, procedures, and information necessary to evaluate and compare the performance of available imaging technologies. Part I updates the earlier work presented in Analysis of Sampled Imaging Systems (2000). Part II discusses performance evaluation of electro-optical imagers. Part III provides computer programs (on a supplemental CD-ROM) and up-to-date information on detector arrays, optics, and display options. The book covers a variety of display formats and interfaces, and provides detailed information on available focal plane arrays (FPAs). Particular emphasis is placed on theory and practice for the wide variety of available infrared FPAs. Technologies represented include InSb, HgCdTe, QWIP, and uncooled thermal arrays. Information is provided on the quantum efficiency, blur, crosstalk, and noise characteristics of each technology. The detector and array dimensions of available FPAs are provided. The information on optics, display, and FPA subassemblies allows the model user to make quick and realistic performance assessments of electro-optical imager designs.…

Paperback. Condición: Brand New. paperback/cd-rom edition. 288 pages. 10.00x7.50x0.50 inches. In Stock.

hardcover. Condición: Fair. Heavy writing underlines highlights readable copy.

hardcover. Condición: As New. Like New Condition.Crisp pages. Clean cover and pages. Book shows no shelf wear. Not Satisfied? Contact us to get a refund.

Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condición: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.…

Condición: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.

Condición: New. pp. xv + 304.

Condición: New.

Condición: New. pp. xv + 304 Illus.

Condición: New. pp. xv + 304.

Paperback. Condición: New. Advancing technology in detector arrays, flat panel displays, and digital image processing provides new opportunities to expand imaging applications and enhance system performance. Technical managers and design engineers are faced with evaluating the cost, weight, and performance of an ever-expanding selection of technology options. This tutorial text provides the theory, procedures, and information necessary to evaluate and compare the performance of available imaging technologies. Part I updates the earlier work presented in Analysis of Sampled Imaging Systems (2000). Part II discusses performance evaluation of electro-optical imagers. Part III provides computer programs (on a supplemental CD-ROM) and up-to-date information on detector arrays, optics, and display options. The book covers a variety of display formats and interfaces, and provides detailed information on available focal plane arrays (FPAs). Particular emphasis is placed on theory and practice for the wide variety of available infrared FPAs. Technologies represented include InSb, HgCdTe, QWIP, and uncooled thermal arrays. Information is provided on the quantum efficiency, blur, crosstalk, and noise characteristics of each technology. The detector and array dimensions of available FPAs are provided. The information on optics, display, and FPA subassemblies allows the model user to make quick and realistic performance assessments of electro-optical imager designs.…

Condición: New.

hardcover. Condición: New. In shrink wrap. Looks like an interesting title.

Hardback. Condición: New. This newly revised and updated edition offers a current and complete introduction to the analysis and design of Electro-Optical (EO) imaging systems. The Third Edition provides numerous updates and several new chapters including those covering Pilotage, Infrared Search and Track, and Simplified Target Acquisition Model. The principles and components of the Linear Shift-Invariant (LSI) infrared and electro-optical systems are detailed in full and help you to combine this approach with calculus and domain transformations to achieve a successful imaging system analysis. Ultimately, the steps described in this book lead to results in quantitative characterizations of performance metrics such as modulation transfer functions, minimum resolvable temperature difference, minimum resolvable contrast, and probability of object discrimination. The book includes an introduction to two-dimensional functions and mathematics which can be used to describe image transfer characteristics and imaging system components. You also learn diffraction concepts of coherent and incoherent imaging systems which show you the fundamental limits of their performance. By using the evaluation procedures contained in this desktop reference, you become capable of predicting both sensor test and field performance and quantifying the effects of component variations. The book contains over 800 time-saving equations and includes numerous analyses and designs throughout. It also includes a reference link to special website prepared by the authors that augments the book in the classroom and serves as an additional resource for practicing engineers. With its comprehensive coverage and practical approach, this is a strong resource for engineers needing a bench reference for sensor and basic scenario performance calculations. Numerous analyses and designs are given throughout the text. It is also an excellent text for upper-level students with an interest in electronic imaging systems.…

Condición: New. In English.

Condición: New.

Condición: As New. Unread book in perfect condition.