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Librería: Ria Christie Collections, Uxbridge, Reino Unido
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Idioma: Inglés
Publicado por John Wiley and Sons Inc, US, 2021
ISBN 10: 1119664004 ISBN 13: 9781119664000
Librería: Rarewaves.com USA, London, LONDO, Reino Unido
EUR 149,10
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Añadir al carritoHardback. Condición: New. Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot devices-electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once-poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource: Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-testsDiscusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraintsHelps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practiceIncludes R code in each chapter for readers to use in their own analyses of one-shot device testing dataFeatures numerous case studies and practical examples throughoutHighlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
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Librería: moluna, Greven, Alemania
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Añadir al carritoCondición: New. NARAYANASWAMY BALAKRISHNAN, PhD, is Distinguished University Professor, Department of Mathematics and Statistics, McMaster University, Hamilton, Ontario, Canada.MAN HO LING, PhD, is Associate Professor, Department of Mathematics and Information Technology, .
Idioma: Inglés
Publicado por John Wiley and Sons Inc, US, 2021
ISBN 10: 1119664004 ISBN 13: 9781119664000
Librería: Rarewaves.com UK, London, Reino Unido
EUR 140,46
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Añadir al carritoHardback. Condición: New. Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot devices-electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once-poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource: Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-testsDiscusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraintsHelps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practiceIncludes R code in each chapter for readers to use in their own analyses of one-shot device testing dataFeatures numerous case studies and practical examples throughoutHighlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.
Librería: AHA-BUCH GmbH, Einbeck, Alemania
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Añadir al carritoBuch. Condición: Neu. Neuware - Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testingEstimating the reliability of one-shot devices--electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once--poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests.Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource:\* Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-tests\* Discusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraints\* Helps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practice\* Includes R code in each chapter for readers to use in their own analyses of one-shot device testing data\* Features numerous case studies and practical examples throughout\* Highlights important issues, problems, and future research directions in reliability theory and practiceAccelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.
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Añadir al carritopaperback. Condición: New. Paperback Pages Number: 222 Language: Chinese. This textbook is divided into 12 chapters. the main contents include the analysis of food composition and analysis of element contents in food and food additives. which the analysis of food nutrients as a key. Sample collection. preparation. preservation and pretreatment are listed separately as a chapter and other chapters of classification describes the determination of food composition. Is presented in addition to the more complete and systema.
Idioma: Chino
Publicado por Chongqing University Press Pub. Date :2007-05-01, 1991
ISBN 10: 7562440174 ISBN 13: 9787562440178
Librería: liu xing, Nanjing, JS, China
EUR 53,31
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Añadir al carritopaperback. Condición: New. Ship out in 2 business day, And Fast shipping, Free Tracking number will be provided after the shipment.Paperback. Pub Date :2007-05-01 Pages: 162 Language: Chinese Publisher :: Chongqing University General Information Title : Recent college TEM4 hearing pro guide ( with CD ) level can not fail English exam books forty-eight Price: 23 yuan Author ::Goodman Zhang Ling . :: Chongqing University Press Publication Date :2007-05-01 ISBN: 9787562440178 words: Page: 162 Edition : 1 Binding: Folio: 16 open product identification : bookuu2407349 Editor nbsp; nbsp; nbsp; nbsp;and Goodman . editor of Th.Four Satisfaction guaranteed,or money back.
Idioma: Chino
Publicado por Haitian Publishing House, 2020
ISBN 10: 7550729212 ISBN 13: 9787550729216
Librería: liu xing, Nanjing, JS, China
EUR 75,67
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Añadir al carritopaperback. Condición: New. Paperback. Pub Date: 336 Language: Chinese Publisher: Haitian Publishing House This book is included in the Shenzhen Secure Police Recruitment Examination Administrative Vocational Ability and Public Quality Test two subjects. including 2017-2019 Five batches of true questions. a total of 10 sets. and invited Hu Xiangyang expert team to prepare an analysis. .
Idioma: Chino
Publicado por Haitian Publishing House, 2021
ISBN 10: 7550731365 ISBN 13: 9787550731363
Librería: liu xing, Nanjing, JS, China
EUR 77,40
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Añadir al carritopaperback. Condición: New. Paperback. Pub Date: 2021-03-01 Pages: 272 Language: Chinese Publisher: Haitian Publishing House Administrative Vocational Ability Test Over the Years Real Questions Detailed Explanation is a kind of Shenzhen Personnel Examination Series. which belongs to the civil service examination books.?This book collects the 2015-2020 Shenzhen Civil Service Examination Real Question Papers. of which 2020 belongs to the Double District Special Recruitment. which is divided into Type I and Type II test pa.
Idioma: Chino
Publicado por Haitian Publishing House, 2021
ISBN 10: 755073027X ISBN 13: 9787550730274
Librería: liu xing, Nanjing, JS, China
EUR 92,25
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Añadir al carritopaperback. Condición: New. Paperback. Pub Date: 2021-02-01 Pages: 436 Language: Chinese Publisher: Haitian Publishing House Administrative Vocational Ability Test Special Textbook is one of the Shenzhen Personnel Test Series.?The preparation of this book is closely related to the exam syllabus. According to the exam syllabus. the writing style is divided into five parts: quantitative relations. language understanding and expression. judgment and reasoning. data analysis. and public basic knowledge. The structure of eac.
Librería: liu xing, Nanjing, JS, China
EUR 124,42
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Añadir al carritopaperback. Condición: New. Language:Chinese.Paperback. Pub Date: 2020-09-01 Publisher: Machinery Industry Press. Fuzikami Rose December Cultivation Notes: Fujiman Moon Rose December Cultivation Notes is the cultivation of the mercury to readers Not only contains the basic knowledge of the vines. the variety recommendation. cultivation month calendar. pest control and cultivation question and answer. etc. more time is axis .