Lawrence c wagner (40 resultados)

Condición: As New. Unread book in perfect condition.

Hard Cover. Condición: Very Good Hardcover. No Dustjacket. First Edition. an ex-hospital copy with minimal markings; pages white and bright; ---------- SATISFACTION GUARANTEED --------- FAST, COURTEOUS SERVICE ------ ALL DUSTJACKETS ARE COVERED WITH NEW CLEAR MYLAR PROTECTOR ----- Size: 7 x 10". Illustrated Throughout (ilustrador). Ex-Library. …

Condición: New.

Hardcover. Condición: Near Fine condition. No jacket, as issued. Facsimile reprint of the 1929 edition. Freeport, New York: Books for Libraries, Inc., 1967. Appears unread. Near Fine. Condition would be FINE but for traces of tiny brown speckles (light foxing) to edges of the text block (as usual with this edition). NOT a library discard. Square and tight. Sharp corners. NO owner's name or bookplate. NO remainder mark. Text is clean and crisp, with NO foxing -- apparently never read. Hardcover. Facsimile reprint of the 1929 edition that was limited to just 600 copies. Illustrated with 5 portraits of Herbert Putnam and two maps. A book about books. This festschrift is crammed with useful and fascinating contributions by Lawrence C. Wroth, Louis R. Wilson, Henry R. Wagner, Oscar G. Sonneck, Harry Miller Lydenberg, Allen Johnson, Lucius Lee Hubbard, Worthington Chauncey Ford, George Watson Cole, J. Christian Bay, R. G. Adams, R. R. Bowker, etc. It includes essays on: Revolutionary War - Fort Moultrie; Tom Sawyer; Early Printed Laws of Massachusetts; Did Columbus Discover Tobago?; Franklin in France; Goethe's Letter to Joseph Green Cogswell; Boston Years of Dr W. F. Poole; Musicology in America; Portolan Atlases; Maryland Colonization Tracts; etc. Bound in the original beige cloth, lettered in black on the spine. Facsimile reprint of the 1929 edition. Hardcover. Near Fine condition/No jacket, as issued. 8vo. x, 555pp.…

Soft cover. Condición: Very Good. 1st Edition. DAW Collector's Book 603. Light edge and corner wear with a flat uncreased spine; no interior markings. Cover art by Vincente Segrelles. This anthology contains: Introduction by Karl Edward Wagner; Uncle Otto's Truck by Stephen King; Out of Africa by David Drake; Names by Jane Yolen; Just Waiting ;by Ramsey Campbell; The Ventriloquist's Daughter by Juleen Brantingham; Elle Est Trois (La Mort) by Tanith Lee; The Man with Legs by Al Sarrantonio; 3:47 AM by David Langford; Mistral by Jon Wynne-Tyson; The Wall-Painting by Roger Johnson; Keepsake by Vincent McHardy; Echoes by Lawrence C. Connolly; After-Images by Malcolm Edwards; Come to the Party by Frances Garfield; The Attic by Billy Wolfenbarger; One for the Horrors by David J. Schow; Spring-Fingered Jack by Susan Casper; and The Flash! Kid by Scott Bradfield. Vincente Segrelles; (ilustrador). Book.…

Hardcover. Condición: Very Good condition. First Edition, Limited to 600 copies. New Haven, Connecticut: Yale University Press, 1929. Very Good condition. 1929 First Edition. Limited to 600 copies. NOT a library discard. Square and tight. NO owner's name or bookplate. Text is clean and crisp, with NO foxing. Hardcover. Illustrated with 5 portraits of Herbert Putnam and two maps. A book about books. This festschrift is crammed with useful and fascinating contributions by Lawrence C. Wroth, Louis R. Wilson, Henry R. Wagner, Oscar G. Sonneck, Harry Miller Lydenberg, Allen Johnson, Lucius Lee Hubbard, Worthington Chauncey Ford, George Watson Cole, J. Christian Bay, R. G. Adams, R. R. Bowker, etc. It includes essays on: Revolutionary War - Fort Moultrie; Tom Sawyer; Early Printed Laws of Massachusetts; Did Columbus Discover Tobago?; Franklin in France; Goethe's Letter to Joseph Green Cogswell; Boston Years of Dr W. F. Poole; Musicology in America; Portolan Atlases; Maryland Colonization Tracts; etc. Typography by Carl Purington Rollins. Bound in the original gilt-stamped blue cloth. First Edition, Limited to 600 copies. Hardcover. Very Good condition. 8vo. x, 555pp.…

Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condición: Used.

Condición: Used.

Condición: Used.

Condición: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc.

hardcover. Condición: New. In shrink wrap. Looks like an interesting title.

Condición: New. In English.

Condición: New.

Condición: New.

Condición: New. In English.

Condición: New. pp. 272.

Condición: New. pp. 276.

Taschenbuch. Condición: Neu. Failure Analysis of Integrated Circuits | Tools and Techniques | Lawrence C. Wagner | Taschenbuch | The Springer International Series in Engineering and Computer Science | xiii | Englisch | 2012 | Springer | EAN 9781461372318 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Condición: New. Provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. This book also includes the coverage of the shortcomings, limitations, and strengths of each technique. Editor(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 17. Weight in Grams: 565. . 1999. 1999th Edition. hardcover. . . . .…

Condición: gut. 1999. Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494, Band 494) In englischer Sprache. pages.

Condición: New. Provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. This book also includes the coverage of the shortcomings, limitations, and strengths of each technique. Editor(s): Wagner, Lawrence C. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 255 pages, biography. BIC Classification: TJFC; TJFD5. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 17. Weight in Grams: 565. . 1999. 1999th Edition. hardcover. . . . . Books ship from the US and Ireland.…

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.…

Condición: As New. Unread book in perfect condition.

Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condición: As New. Unread book in perfect condition.

Condición: new. Questo è un articolo print on demand.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 272 pp. Englisch.…

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 276 pp. Englisch.…