Lala parag k (50 resultados)

Hardcover. Condición: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

hardcover. Condición: Very Good.

Condición: very_good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in very good condition! The cover and any other included accessories are also in very good condition showing some minor use. The spine is straight, there are no rips tears or creases on the cover or the pages.…

paperback. Condición: Good. Our good condition books are generally good for reading but not for gifting or collecting. They could have imperfections such as creasing, fanning, inscriptions, margin notes, yellowing, staining on edge or cover or pages, bumps, scuffs, etc etc (sometimes multiple of these). It's a wide category that encompasses anything that isn't almost-new down to anything that is slightly better than poor. We would NOT recommend gifting Good books - these should be considered reading copies. Our books are dispatched from a Yorkshire former cotton mill. We list via barcode/ISBN so please note that the images are stock images and may not be the exact copy you receive, furthermore the details about edition and year might not be accurate as many publishers reuse the same ISBN for multiple editions and as we simply scan a barcode or enter an ISBN we do not check the validity of the edition data when listing. If you're looking for an exact edition please don't order (at least not without checking with us first, although we don't always have time to check). We aim to dispatch prompty, the service used will depend on order value and book size. We can ship to most countries, see our shipping policies. Payment is via Abe only.…

Softcover. Condición: Très bon. Ancien livre de bibliothèque. Petite(s) trace(s) de pliure sur la couverture. Légères traces d'usure sur la couverture. Salissures sur la tranche. Couverture différente. Edition 1985. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisat ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Stains on the edge. Different cover. Edition 1985. Ammareal gives back up to 15% of this item's net price to charity organizations.…

Paperback. Condición: Good. Book in Good condition.

Soft cover. Condición: New. Contents 1. Basic concepts of reliability. 2. Faults in digital circuits. 3. Test generation. 4. Fault tolerant design of digital systems. 5. Self checking and fail safe logic. 6. Design for testability. 7. Conclusion. Appendix Markov Models. Reference. Annotated bibliography. Index. Fault Tolerance and Testability have the common objective of improving the reliability of computer hardware. This book has been written for the students of Electrical Engineering and Computer Sciences. Chapter 1 deals with the basics of reliability theory chapter 2 covers most of the important faults chapter 3 about fault detection chapter 4 discusses many classes of hardware fault tolerance techniques chapter 5 presents recent developments chapter 6 focuses on various design techniques and chapter 7 highlights the current research issues. The entire text is prepared in lucid language with sufficient basic techniques and examples for easy understanding. Features A systematic study of the various fault tolerant architectures in use. An in depth review of the basic characteristics of self checking logic detailed descriptions of all the major hardware techniques that may be used in fault tolerant and testable design. Comparisons of the various possible techniques for dealing with a problem and assessment of their suitability in various situations. Sections on the fault tolerant design of VLSI chips and state of the art problems still being researched over 200 line drawings and tables. Extensive references at the end of each chapter to facilitate further reading on specialist topics. An annotated bibliography listing textbooks journal articles and conference proceedings on the subject. 264 pp.…

Condición: Good. Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.

Hardcover. Condición: Very Good. VG+ showing minimal wear.

Condición: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,950grams, ISBN:9780023671715. …

Hardcover. Condición: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Condición: Used, like new. Glossy black hardcover with cover photo of a ripples in a pool of water, 2001, 216pp. Slightest shelf wear otherwise perfect condition. **We are a small family business selling fine new and pre-owned books online since 1999, providing professional service and individual attention to your order, daily shipments and sturdy packing.…

Condición: New.

Condición: As New. Unread book in perfect condition.

Condición: New. 1st edition NO-PA16APR2015-KAP.

Condición: New. Satisfaction Guaranteed or your money back.

Condición: New.

Condición: As New. Unread book in perfect condition.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References.…

HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Condición: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.…

Condición: new.

Condición: New.

Condición: As New. Unread book in perfect condition.

Condición: New.

Condición: As New. Unread book in perfect condition.

Condición: New.

Hardcover. Condición: New. Brand new book, sourced directly from publisher. Dispatch time is 3-4 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

Condición: New. In English.

Hardback. Condición: New. New copy - Usually dispatched within 4 working days.