Kumar ch sateesh (54 resultados)

PAP. Condición: Used - Very Good. Used - Like New Book. Shipped from UK. Established seller since 2000.

Condición: As New. Unread book in perfect condition.

Condición: New.

Paperback / softback. Condición: New. New copy - Usually dispatched within 4 working days.

Condición: New.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Paperback / softback. Condición: New. New copy - Usually dispatched within 4 working days.

Condición: New.

Condición: New. 1st edition NO-PA16APR2015-KAP.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Condición: New.

Paperback. Condición: New. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. …

Condición: New.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Condición: As New. Unread book in perfect condition.

Condición: New. In English.

Condición: New. In English.

Paperback. Condición: Brand New. 144 pages. 9.18x6.12x9.21 inches. In Stock.

Paperback. Condición: Brand New. 118 pages. 9.18x6.12x9.21 inches. In Stock.

Condición: New. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like super.

Condición: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Condición: As New. Unread book in perfect condition.

Paperback. Condición: New. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. …

Condición: New.

Condición: New.

Condición: New.

Condición: New.

Condición: New.

Condición: As New. Unread book in perfect condition.