John mcgilp (17 resultados)
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Librería: The Bookseller, Edmonton, AB, CanadaThe Bookseller
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Hardcover. Condición: Good+. No Jacket. A little reading wear. Otherwsie a solid, unmarked volume.
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Librería: Chris Morris Books, Oxford, OXON, Reino UnidoChris Morris Books
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EUR 29,61
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Hardcover. Condición: Very Good. An investigation into optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These techniques have been widely applied to semiconductor surfaces and interfaces, and include polarised reflection techniques such as reflection anisot…ropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epitoptics' potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has been demonstrated in growth reactors under normal operating conditions. The book emphasizes studies of submonolayer growth on semiconductor surfaces. Chapters include: Spectroscopic Ellipsometry Reflection Difference Techniques Raman Spectroscopy Photoluminescence Spectroscopy On the Theory of Second Harmonic Generation Second Harmonic and Sum Frequency Generation Conclusions Hardback, pp230.
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Editorial: Luss Heritage Group 2010
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- Primera edición
Librería: Hanselled Books, Burntisland, FIFE, Reino UnidoHanselled Books
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Condición: Usado - Bueno
EUR 39,45
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Soft cover. Condición: Very Good. No Jacket. 1st Edition. P/B 110 pages condition is Very good.
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 60,73
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Condición: New. In.
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Librería: Chiron Media, Wallingford, Reino UnidoChiron Media
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EUR 57,11
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Paperback. Condición: New.
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 80,16
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Condición: New. pp. 248.
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 79,81
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Paperback. Condición: Brand New. reprint edition. 242 pages. 9.25x6.10x0.80 inches. In Stock.
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 53,49
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with submonolayer resolution, has been s…hown to be possible using optical techniques (where 'optical' applies to electromagnetic radiation in and around the visible region of the spectrum). This book describes these 'epioptic' techniques, which have now been quite widely applied to semiconductor surfaces and interfaces. Particular emphasis in the book is placed on recent studies of submonolayer growth on well-characterised semiconductor surfaces, many of which have arisen from CEC DGJGII ESPRIT Basic Research Action No. 3177 'EPIOPTIC', and CEU DGIII ESPRIT Basic Research Action No. 6878 'EASI'. Techniques using other areas of the spectrum such as the infra-red region (IR spectroscopy, in its various surface configurations), and the x-ray region (surface x-ray diffraction, x-ray standing wave), are omitted. The optical techniques described use simple lamp or small laser sources and are thus, in principle, easily accessible. Epioptic probes can provide new information on solid-gas, solid-liquid and liquid-liquid interfaces. They are particularly suited to growth monitoring. Emerging process technologies for fabricating submicron and nanoscale semiconductor devices and novel multilayer materials, whether based on silicon or compound semiconductors, all require extremely precise control of growth at surfaces. In situ, non-destructive, real-time monitoring and characterisation of surfaces under growth conditions is needed for further progress. Both atomic scale resolution, and non-destructive characterisation of buried structures, are required.
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Librería: preigu, Osnabrück, Alemaniapreigu
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EUR 50,35
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Taschenbuch. Condición: Neu. Epioptics | Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces | John F. McGilp (u. a.) | Taschenbuch | ESPRIT Basic Research Series | xii | Englisch | 2011 | Springer | EAN 9783642798221 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg,… juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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EUR 100,42
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Paperback. Condición: Like New. Like New. book.
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Librería: Buchpark, Trebbin, AlemaniaBuchpark
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EUR 61,38
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Condición: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 46,22
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Condición: new. Questo è un articolo print on demand.
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 53,49
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with submonolayer resolu…tion, has been shown to be possible using optical techniques (where 'optical' applies to electromagnetic radiation in and around the visible region of the spectrum). This book describes these 'epioptic' techniques, which have now been quite widely applied to semiconductor surfaces and interfaces. Particular emphasis in the book is placed on recent studies of submonolayer growth on well-characterised semiconductor surfaces, many of which have arisen from CEC DGJGII ESPRIT Basic Research Action No. 3177 'EPIOPTIC', and CEU DGIII ESPRIT Basic Research Action No. 6878 'EASI'. Techniques using other areas of the spectrum such as the infra-red region (IR spectroscopy, in its various surface configurations), and the x-ray region (surface x-ray diffraction, x-ray standing wave), are omitted. The optical techniques described use simple lamp or small laser sources and are thus, in principle, easily accessible. Epioptic probes can provide new information on solid-gas, solid-liquid and liquid-liquid interfaces. They are particularly suited to growth monitoring. Emerging process technologies for fabricating submicron and nanoscale semiconductor devices and novel multilayer materials, whether based on silicon or compound semiconductors, all require extremely precise control of growth at surfaces. In situ, non-destructive, real-time monitoring and characterisation of surfaces under growth conditions is needed for further progress. Both atomic scale resolution, and non-destructive characterisation of buried structures, are required. 248 pp. Englisch.
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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EUR 80,82
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Condición: New. Print on Demand pp. 248 120 Figures, 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 80,17
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Condición: New. PRINT ON DEMAND pp. 248.
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Librería: moluna, Greven, Alemaniamoluna
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EUR 48,37
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with subm…onolayer resolution, has been shown to b.
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
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EUR 53,49
Envío por EUR 60,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with submonolayer resolution…, has been shown to be possible using optical techniques (where 'optical' applies to electromagnetic radiation in and around the visible region of the spectrum). This book describes these 'epioptic' techniques, which have now been quite widely applied to semiconductor surfaces and interfaces. Particular emphasis in the book is placed on recent studies of submonolayer growth on well-characterised semiconductor surfaces, many of which have arisen from CEC DGJGII ESPRIT Basic Research Action No. 3177 'EPIOPTIC', and CEU DGIII ESPRIT Basic Research Action No. 6878 'EASI'. Techniques using other areas of the spectrum such as the infra-red region (IR spectroscopy, in its various surface configurations), and the x-ray region (surface x-ray diffraction, x-ray standing wave), are omitted. The optical techniques described use simple lamp or small laser sources and are thus, in principle, easily accessible. Epioptic probes can provide new information on solid-gas, solid-liquid and liquid-liquid interfaces. They are particularly suited to growth monitoring. Emerging process technologies for fabricating submicron and nanoscale semiconductor devices and novel multilayer materials, whether based on silicon or compound semiconductors, all require extremely precise control of growth at surfaces. In situ, non-destructive, real-time monitoring and characterisation of surfaces under growth conditions is needed for further progress. Both atomic scale resolution, and non-destructive characterisation of buried structures, are required.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 248 pp. Englisch.
