Graydon larrabee (12 resultados)
Editorial: McGraw Hill, New York, 1970
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- Primera edición
Librería: P.C. Schmidt, Bookseller, Kettering, OH, Estados Unidos de AmericaP.C. Schmidt, Bookseller
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Bueno
EUR 9,72
Envío por EUR 4,29Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Añadir al carritoHard Cover. Condición: Very Good. First Edition. a very good hardcover; an ex-library copy with usual markings; internally pages bright and clean; ---------- SATISFACTION GUARANTEED --------- FAST, COURTEOUS SERVICE ------ ALL ORDERS SHIPPED WITH DELIVERY CONFIRMATION; Size: 7 x 10". Ex-Library.
Editorial: McGraw-Hill Book Co, New York, 1970
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- Primera edición
Librería: Rivermead Books, Southampton., Reino UnidoRivermead Books
Contactar con el vendedorVendedor de 2 estrellasCondición: Usado - Bueno
EUR 14,42
Envío por EUR 24,50Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Añadir al carritoCloth. Condición: Very Good. Estado de la sobrecubierta: Good. First Edition. VG/Good, orange-brown pictorial dj in transparent dw and with white titles on spine faded to grey, ex-Royal Aircraft Establishment Library, contents are clean and unmarked, large octavo 351pp. Weight 900g so an oversized and overweight book that will r…equire extra shipping charges. A book in the Texas Instruments Electronic series. Semiconductor principles; bulk-material characterization; materials characterization in single-crystal growth; analysis of single-crystals for chemical imperfections; characterization of single crystals for physical imperfections; characterization of semiconductor surfaces; characterization of epitaxial films; diffusion; characterization of thin films. Ex-Library.
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- Primera edición
Librería: Feldman's Books, Menlo Park, CA, Estados Unidos de AmericaFeldman's Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Excelente
EUR 57,44
Envío por EUR 3,86Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: Fine. 1st Edition. No Markings.
Editorial: Library stamps/marks on first free endpaper and titelpage. Text clean. Plenum Press, New York.
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Librería: Antiquariaat Ovidius, Bredevoort, HolandaAntiquariaat Ovidius
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado
EUR 24,00
Envío por EUR 22,00Se envía de Holanda a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Añadir al carritoCondición: Gebraucht / Used. third printing. 1978. Hardcover. xviii,670pp.
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 116,41
Envío por EUR 13,98Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. In.
Materials and Process Characterization: VLSI Electronics Microstructure Science, Vol. 6
Einspruch, Norman G. (Editor)/ Larrabee, Graydon B. (Series Editor)
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 118,04
Envío por EUR 17,50Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Paperback. Condición: Brand New. 614 pages. 9.25x6.00x1.39 inches. In Stock.
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 150,49
Envío por EUR 3,42Se envía dentro de Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. pp. 692.
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- Primera edición
Librería: True Oak Books, Highland, NY, Estados Unidos de AmericaTrue Oak Books
Contactar con el vendedorVendedor de 5 estrellasMiembro de asociación: IOBA
Condición: Usado - Aceptable
EUR 176,73
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponibles
Hardcover. Condición: Good. No Dust Jacket. First Edition; Second Printing. 598 pages; Ex-Library copy with usual identifiers. Charts. Graphs. Crack on title page gutter, as well as the rear inner hinge. Book is structurally sound nonetheless. Minor shelf rubbing on the covers and spine. Good condition otherwise. No other notewo…rthy defects. No markings on text pages.; - Your satisfaction is our priority. We offer free returns and respond promptly to all inquiries. Your item will be carefully cushioned in bubble wrap and securely boxed. All orders ship on the same or next business day. Buy with confidence.
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Librería: moluna, Greven, Alemaniamoluna
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 128,20
Envío por EUR 48,99Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling pro.
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 160,20
Envío por EUR 65,87Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Taschenbuch. Condición: Neu. Neuware - Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which elimina…ted the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, 'Materials Character ization,' to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 153,15
Envío por EUR 7,58Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. Print on Demand pp. 692 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 159,23
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. PRINT ON DEMAND pp. 692.
