Bhushan manjul (47 resultados)

hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Condición: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Condición: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Condición: New. In English.

Condición: New.

Condición: New.

Condición: New. In English.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.…

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors' overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.…

Taschenbuch. Condición: Neu. Microelectronic Test Structures for CMOS Technology | Manjul Bhushan (u. a.) | Taschenbuch | xxxiv | Englisch | 2014 | Springer | EAN 9781489990556 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Taschenbuch. Condición: Neu. CMOS Test and Evaluation | A Physical Perspective | Manjul Bhushan (u. a.) | Taschenbuch | xiii | Englisch | 2016 | Humana | EAN 9781493947027 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Condición: New.

Condición: New. pp. 408.

Condición: New. pp. 424.

Condición: New. In English.

Condición: New. In English.

Paperback. Condición: Brand New. reprint edition. 437 pages. 9.25x6.10x1.00 inches. In Stock.

Condición: New.

Condición: As New. Unread book in perfect condition.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors' overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.…

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.…

Condición: New. pp. 408.

Condición: New.

Condición: As New. Unread book in perfect condition.

Hardcover. Condición: Brand New. 437 pages. 9.50x6.50x1.25 inches. In Stock.

Hardcover. Condición: Brand New. 373 pages. 9.50x6.50x1.00 inches. In Stock.

Condición: As New. Unread book in perfect condition.

Condición: As New. Unread book in perfect condition.

Condición: new. Questo è un articolo print on demand.

Condición: new. Questo è un articolo print on demand.