Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Librería: SN Books Ltd, Thetford, Reino Unido
hardcover. Condición: Very Good. Orders shipped daily from the UK. Professional seller. Nº de ref. del artículo: mon0000504473
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Librería: BooksRun, Philadelphia, PA, Estados Unidos de America
Hardcover. Condición: Very Good. Second Edition 1998. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting. Nº de ref. del artículo: 3540639764-11-1
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Librería: ThriftBooks-Atlanta, AUSTELL, GA, Estados Unidos de America
Hardcover. Condición: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less. Nº de ref. del artículo: G3540639764I4N00
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Librería: Hübner Einzelunternehmen, Hamburg, HH, Alemania
Pp. 2., completely rev. and updated ed. XIV, 527 S. : Ill., graph. Darst. ; 24 cm Sprache: Englisch Gewicht in Gramm: 882. Nº de ref. del artículo: 114822
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Librería: Buchpark, Trebbin, Alemania
Condición: Gut. Zustand: Gut | Seiten: 544 | Sprache: Englisch | Produktart: Bücher | Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. Nº de ref. del artículo: 706699/3
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Librería: BennettBooksLtd, Los Angeles, CA, Estados Unidos de America
hardcover. Condición: New. In shrink wrap. Looks like an interesting title! Nº de ref. del artículo: Q-3540639764
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Librería: moluna, Greven, Alemania
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Main benefit is information about the physics of image formation and microanalysis in scanning electron microscopy2nd, completely revised and updated editionMain benefit is information about the physics of image formation and microanalysis in sca. Nº de ref. del artículo: 458677204
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. 544 pp. Englisch. Nº de ref. del artículo: 9783540639763
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 544 pp. Englisch. Nº de ref. del artículo: 9783540639763
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Librería: AHA-BUCH GmbH, Einbeck, Alemania
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. Nº de ref. del artículo: 9783540639763
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