Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August ... (Lecture Notes in Computer Science, 4109) - Tapa blanda

 
9783540372363: Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August ... (Lecture Notes in Computer Science, 4109)
Tapa blanda
ISBN 10: 3540372369 ISBN 13: 9783540372363
Editorial: Springer, 2006

Sinopsis

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.

"Sinopsis" puede pertenecer a otra edición de este libro.

Reseña del editor

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Springer
Año de publicación
2006
Idioma
Inglés
ISBN 10 
3540372369
ISBN 13 
9783540372363
Encuadernación
Tapa blanda
Número de páginas
968
Editor
Fred Ana, Yeung Dit-Yan, Kwok James T.
Contacto del fabricante
no disponible
Persona responsable
CMN Printpool Inh. Mathis Neumann
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