Scanning probe microscopy characterization (26 resultados)
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Condición: New. Covering a diverse range of practical applications and real-world examples, Scanning Probe Microscopy for Industrial Applications examines important and successful applications of SPM in various industries, including food science, personal care industry, and forestry applications. Author D.G. Num Pages: 368 pages…, Illustrations. BIC Classification: PDND; TBN. Category: (P) Professional & Vocational. Dimension: 243 x 155 x 24. Weight in Grams: 670. . 2013. 1st Edition. Hardcover. . . . .
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Condición: New. Covering a diverse range of practical applications and real-world examples, Scanning Probe Microscopy for Industrial Applications examines important and successful applications of SPM in various industries, including food science, personal care industry, and forestry applications. Author D.G. Num Pages: 368 pages…, Illustrations. BIC Classification: PDND; TBN. Category: (P) Professional & Vocational. Dimension: 243 x 155 x 24. Weight in Grams: 670. . 2013. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
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Buch. Condición: Neu. Neuware - Describes new state-of-the-science tools and their contribution to industrial R&DWith contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality c…ontrol and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others.Scanning Probe Microscopy for Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments.The second half of the book describes applications of nanomechanical characterization in industry, including:\* New formulation development for pharmaceuticals\* Measurement of critical dimensions and thin dielectric films in the semiconductor industry\* Effect of humidity and temperature on biomaterials\* Characterization of polymer blends to guide product formulation in the chemicals sector\* Unraveling links between food structure and function in the food industryContributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems.By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy for Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.
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Buch. Condición: Neu. Scanning Probe Microscopy in Industrial Applications | Nanomechanical Characterization | Dalia G Yablon | Buch | Contributors List xiiiPreface xvAcknowledgments xix1. Overview of Atomic Force Microscopy 1Dalia G. Yablon1.1 A Word on Nomenclature 21.2 Atomic Force Microscopy--The Appeal to Industrial R&D 21.…3 Mechanical Properties 51.4 Overview of AFM Operation 61.5 | Englisch | 2014 | Wiley | EAN 9781118288238 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu.
Idioma: Inglés
Editorial: Springer, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Libro 147 de 241. Libro 147 de 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
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Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Libro 147 de 241. Libro 147 de 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Libro 147 de 241. Libro 147 de 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Editorial: Springer Netherlands, 2005
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Gebunden. Condición: New. As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming.
Idioma: Inglés
Editorial: Springer Netherlands, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Libro 147 de 241. Libro 147 de 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Kartoniert / Broschiert. Condición: New. As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming.
Scanning Probe Microscopy: Characterization, Nanofabricatoin And Device Application of Functional Materials
Vilarinho, Paula Maria (Editor)/ Rosenwaks, Yossi (Editor)/ Kingon, Angus I. (Editor)
Idioma: Inglés
Editorial: Kluwer Academic Pub, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Libro 147 de 241. Libro 147 de 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Editorial: Springer Feb 2005, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Libro 147 de 241. Libro 147 de 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Taschenbuch. Condición: Neu. Neuware - As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key… role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Idioma: Inglés
Editorial: Springer Nature B.V. Mär 2005, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Libro 147 de 241. Libro 147 de 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Buch. Condición: Neu. Neuware - As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role i…n nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
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Buch. Condición: Neu. Scanning Probe Microscopy | Physical Property Characterization at Nanoscale | Vijay Nalladega | Buch | 256 S. | Englisch | 2012 | IntechOpen | EAN 9789535105763 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu Print on Dema…nd.
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Buch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanni…ng probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.
Idioma: Inglés
Editorial: Springer, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Libro 147 de 241. Libro 147 de 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Librería: Basi6 International, Irving, TX, Estados Unidos de AmericaBasi6 International
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Condición: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
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Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Libro 147 de 241. Libro 147 de 241 - NATO Science Series II: Mathematics, Physics and Chemistry
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Librería: Basi6 International, Irving, TX, Estados Unidos de AmericaBasi6 International
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Condición: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
