Isbn: 9789813203303 - mosfet modeling for vlsi simulation: theory and practice: 0 (international series on advances in solid state electronics and technology) (15 resultados)

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  • Idioma: Inglés

    Editorial: World Scientific Publishing Company, 2007

    9813203307 / 9789813203303

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    Editorial: World Scientific Publishing Co Pte Ltd, 2007

    9813203307 / 9789813203303

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    Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de AmericaPBShop.store US

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    PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

  • Idioma: Inglés

    Editorial: World Scientific Publishing Co Pte Ltd, SG, 2007

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    Librería: Rarewaves.com USA, London, LONDO, Reino UnidoRarewaves.com USA

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    Paperback. Condición: New. A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations.The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs.

  • Idioma: Inglés

    Editorial: World Scientific Publishing Company, 2007

    9813203307 / 9789813203303

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    Librería: California Books, Miami, FL, Estados Unidos de AmericaCalifornia Books

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    EUR 78,99

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  • Idioma: Inglés

    Editorial: World Scientific Publishing Company, 2007

    9813203307 / 9789813203303

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    Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices

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    Condición: Usado - Como Nuevo

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    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: World Scientific Publishing Co Pte Ltd, 2007

    9813203307 / 9789813203303

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    Librería: PBShop.store UK, Fairford, GLOS, Reino UnidoPBShop.store UK

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    Cantidad disponible: 15 disponibles

    PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

  • Idioma: Inglés

    Editorial: World Scientific Publishing Co Pte Ltd, Singapore, 2007

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    Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de AmericaGrand Eagle Retail

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    EUR 88,74

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    Paperback. Condición: new. Paperback. A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations.The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

  • Idioma: Inglés

    Editorial: World Scientific Publishing Company, 2007

    9813203307 / 9789813203303

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    Condición: New. In English.

  • Idioma: Inglés

    Editorial: World Scientific Publishing Company, 2007

    9813203307 / 9789813203303

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    Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK

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    Condición: Nuevo

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    Condición: New.

  • Idioma: Inglés

    Editorial: World Scientific Publishing Company, 2007

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    Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK

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    Condición: Usado - Como Nuevo

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    Condición: As New. Unread book in perfect condition.

  • Idioma: Inglés

    Editorial: World Scientific Pub Co Inc, 2007

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    Paperback. Condición: Brand New. reprint edition. 632 pages. 9.02x6.22x1.30 inches. In Stock.

  • Idioma: Inglés

    Editorial: World Scientific Publishing Co Pte Ltd, SG, 2007

    9813203307 / 9789813203303

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    Librería: Rarewaves.com UK, London, Reino UnidoRarewaves.com UK

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    Cantidad disponible: 12 disponibles

    Paperback. Condición: New. A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations.The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs.

  • Idioma: Inglés

    Editorial: World Scientific Publishing Co Pte Ltd, Singapore, 2007

    9813203307 / 9789813203303

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    Librería: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller

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    Cantidad disponible: 1 disponibles

    Paperback. Condición: new. Paperback. A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations.The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

  • Idioma: Inglés

    Editorial: World Scientific Publishing Company, 2007

    9813203307 / 9789813203303

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    Librería: moluna, Greven, Alemaniamoluna

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    EUR 118,79

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    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. KlappentextrnrnA reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first c.

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    Idioma: Inglés

    Editorial: World Scientific, 2007

    9813203307 / 9789813203303

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    Taschenbuch. Condición: Neu. MOSFET MODELING FOR VLSI SIMULATION | Arora Narain | Taschenbuch | Kartoniert / Broschiert | Englisch | 2007 | World Scientific | EAN 9789813203303 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.