Idioma: Inglés
Publicado por World Scientific Publishing Company, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 73,30
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Añadir al carritoCondición: New.
Idioma: Inglés
Publicado por World Scientific Publishing Co Pte Ltd, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de America
EUR 75,64
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Añadir al carritoPAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.
Idioma: Inglés
Publicado por World Scientific Publishing Co Pte Ltd, SG, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: Rarewaves.com USA, London, LONDO, Reino Unido
EUR 75,85
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Añadir al carritoPaperback. Condición: New. A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations.The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs.
Idioma: Inglés
Publicado por World Scientific Publishing Company, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 75,42
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Idioma: Inglés
Publicado por World Scientific Publishing Co Pte Ltd, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
EUR 76,41
Cantidad disponible: 15 disponibles
Añadir al carritoPAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.
Idioma: Inglés
Publicado por World Scientific Publishing Company, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 69,50
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Añadir al carritoCondición: New. In.
Idioma: Inglés
Publicado por World Scientific Publishing Co Pte Ltd, Singapore, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de America
EUR 87,39
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Añadir al carritoPaperback. Condición: new. Paperback. A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations.The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Idioma: Inglés
Publicado por World Scientific Publishing Company, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 71,07
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Añadir al carritoCondición: New.
Idioma: Inglés
Publicado por World Scientific Publishing Company, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 76,36
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Idioma: Inglés
Publicado por World Scientific Pub Co Inc, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: Revaluation Books, Exeter, Reino Unido
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Añadir al carritoPaperback. Condición: Brand New. reprint edition. 632 pages. 9.02x6.22x1.30 inches. In Stock.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
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Librería: Books Puddle, New York, NY, Estados Unidos de America
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Añadir al carritoCondición: New. pp. 632.
Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 115,13
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Librería: Majestic Books, Hounslow, Reino Unido
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Añadir al carritoCondición: New. pp. 632 270 Figures, 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
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Añadir al carritoCondición: New.
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Idioma: Inglés
Publicado por World Scientific Publishing Co Pte Ltd, SG, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: Rarewaves.com UK, London, Reino Unido
EUR 71,08
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Añadir al carritoPaperback. Condición: New. A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations.The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs.
Idioma: Inglés
Publicado por World Scientific Publishing Co Pte Ltd, Singapore, 2007
ISBN 10: 9813203307 ISBN 13: 9789813203303
Librería: AussieBookSeller, Truganina, VIC, Australia
EUR 134,49
Cantidad disponible: 1 disponibles
Añadir al carritoPaperback. Condición: new. Paperback. A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations.The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Librería: preigu, Osnabrück, Alemania
EUR 95,70
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Añadir al carritoTaschenbuch. Condición: Neu. MOSFET Models for VLSI Circuit Simulation | Theory and Practice | Narain D. Arora | Taschenbuch | XXII | Englisch | 2012 | Springer | EAN 9783709192498 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Librería: Revaluation Books, Exeter, Reino Unido
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Añadir al carritoPaperback. Condición: Brand New. 632 pages. 9.61x6.69x1.43 inches. In Stock.
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 106,99
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Añadir al carritoTaschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Metal Oxide Semiconductor (MOS) transistors are the basic building block ofMOS integrated circuits (I C). Very Large Scale Integrated (VLSI) circuits using MOS technology have emerged as the dominant technology in the semiconductor industry. Over the past decade, the complexity of MOS IC's has increased at an astonishing rate. This is realized mainly through the reduction of MOS transistor dimensions in addition to the improvements in processing. Today VLSI circuits with over 3 million transistors on a chip, with effective or electrical channel lengths of 0. 5 microns, are in volume production. Designing such complex chips is virtually impossible without simulation tools which help to predict circuit behavior before actual circuits are fabricated. However, the utility of simulators as a tool for the design and analysis of circuits depends on the adequacy of the device models used in the simulator. This problem is further aggravated by the technology trend towards smaller and smaller device dimensions which increases the complexity of the models. There is extensive literature available on modeling these short channel devices. However, there is a lot of confusion too. Often it is not clear what model to use and which model parameter values are important and how to determine them. After working over 15 years in the field of semiconductor device modeling, I have felt the need for a book which can fill the gap between the theory and the practice of MOS transistor modeling. This book is an attempt in that direction.
Idioma: Inglés
Publicado por World Scientific Pub Co Inc, 2007
ISBN 10: 981256862X ISBN 13: 9789812568625
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 227,95
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Añadir al carritoCondición: New.
Idioma: Inglés
Publicado por World Scientific Publishing Co Pte Ltd, 2007
ISBN 10: 981256862X ISBN 13: 9789812568625
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de America
EUR 230,29
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Añadir al carritoHRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.
Idioma: Inglés
Publicado por World Scientific Pub Co Inc, 2007
ISBN 10: 981256862X ISBN 13: 9789812568625
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 245,40
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Idioma: Inglés
Publicado por World Scientific Publishing Co Pte Ltd, 2007
ISBN 10: 981256862X ISBN 13: 9789812568625
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
EUR 242,79
Cantidad disponible: 15 disponibles
Añadir al carritoHRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.
Idioma: Inglés
Publicado por World Scientific Pub Co Inc, 2007
ISBN 10: 981256862X ISBN 13: 9789812568625
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 237,69
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Añadir al carritoCondición: New.
Idioma: Inglés
Publicado por World Scientific Pub Co Inc, 2007
ISBN 10: 981256862X ISBN 13: 9789812568625
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
EUR 243,41
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Idioma: Inglés
Publicado por World Scientific Pub Co Inc, 2007
ISBN 10: 981256862X ISBN 13: 9789812568625
Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 249,01
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Añadir al carritoCondición: New. In.
Idioma: Inglés
Publicado por World Scientific Publishing Co Pte Ltd, SG, 2007
ISBN 10: 981256862X ISBN 13: 9789812568625
Librería: Rarewaves.com USA, London, LONDO, Reino Unido
EUR 302,93
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Añadir al carritoHardback. Condición: New. Illustrated. A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school classrooms, and manufacturing engineering, over a decade ago. The first comprehensive book on MOS transistor compact modeling, it was the most cited among similar books in the area and remains the most frequently cited today. The coverage is device-physics based and continues to be relevant to the latest advances in MOS transistor modeling. This is also the only book that discusses in detail how to measure device model parameters required for circuit simulations.The book deals with the MOS Field Effect Transistor (MOSFET) models that are derived from basic semiconductor theory. Various models are developed, ranging from simple to more sophisticated models that take into account new physical effects observed in submicron transistors used in today's (1993) MOS VLSI technology. The assumptions used to arrive at the models are emphasized so that the accuracy of the models in describing the device characteristics are clearly understood. Due to the importance of designing reliable circuits, device reliability models are also covered. Understanding these models is essential when designing circuits for state-of-the-art MOS ICs.