9789811304538 - progress in nanoscale characterization and manipulation: 272 (springer tracts in modern physics, 272) de wang (9 resultados)
Idioma: Inglés
Editorial: Singapore, Springer, 2018
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EUR 17,00
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Hardcover. Condición: Gut. VII, 508. 333 illus., 26 illus. in color Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02774 9789811304538 Sprache: Englisch Gewicht in Gramm: 1150.
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Editorial: Springer Nature Singapore, 2018
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Librería: Buchpark, Trebbin, AlemaniaBuchpark
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Condición: Hervorragend. Zustand: Hervorragend | Seiten: 516 | Sprache: Englisch | Produktart: Bücher | This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microa…nalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
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Editorial: Springer, 2018
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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Condición: New. In.
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Editorial: Springer, Springer, 2018
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their…crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
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Editorial: Springer Verlag, 2018
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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Hardcover. Condición: Brand New. 508 pages. 9.25x6.25x1.75 inches. In Stock.
Idioma: Inglés
Editorial: Springer, 2018
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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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Hardcover. Condición: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Idioma: Inglés
Editorial: Springer Nature Singapore Sep 2018, 2018
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 171,19
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and…examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. 516 pp. Englisch.
Progress in Nanoscale Characterization and Manipulation
Wang, Rongming|Wang, Chen|Zhang, Hongzhou|Tao, Jing|Bai, Xuedong
Idioma: Inglés
Editorial: Springer Singapore, 2018
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Librería: moluna, Greven, Alemaniamoluna
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EUR 144,94
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in sc…anning electron mic.
Idioma: Inglés
Editorial: Springer, Springer Sep 2018, 2018
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
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EUR 171,19
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Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron microscopy, transmis…sion electron microscopy and helium ion microscopyExplores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniquesSpringer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 516 pp. Englisch.
