9789048197248 - low-power high-resolution analog to digital converters: design, test and calibration (analog circuits and signal processing) de zjajo, amir; pineda de gyvez, jose (10 resultados)
Idioma: Inglés
Editorial: Springer, 2010
Serie: Libro 25 de 124 - Analog Circuits and Signal Processing
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Librería: Basi6 International, Irving, TX, Estados Unidos de AmericaBasi6 International
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EUR 60,52
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Condición: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
Idioma: Inglés
Editorial: Springer, 2010
Serie: Libro 25 de 124 - Analog Circuits and Signal Processing
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 61,21
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Condición: New. In.
Idioma: Inglés
Editorial: Springer, 2010
Serie: Libro 25 de 124 - Analog Circuits and Signal Processing
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 80,65
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Condición: New. pp. 316.
Idioma: Inglés
Editorial: Springer, 2010
Serie: Libro 25 de 124 - Analog Circuits and Signal Processing
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 59,97
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a… great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods.In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurementsfrom the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.
Idioma: Inglés
Editorial: Springer, 2010
Serie: Libro 25 de 124 - Analog Circuits and Signal Processing
- Tapa dura
Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
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Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Idioma: Inglés
Editorial: Springer, 2010
Serie: Libro 25 de 124 - Analog Circuits and Signal Processing
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- Impresión bajo demanda
Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 46,22
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Condición: new. Questo è un articolo print on demand.
Idioma: Inglés
Editorial: SPRINGER NATURE Nov 2010, 2010
Serie: Libro 25 de 124 - Analog Circuits and Signal Processing
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 53,49
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has rece…ntly generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods.In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology. 293 pp. Englisch.
Idioma: Inglés
Editorial: Springer, 2010
Serie: Libro 25 de 124 - Analog Circuits and Signal Processing
- Tapa dura
- Impresión bajo demanda
Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 79,00
Envío por EUR 7,60Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. Print on Demand pp. 316 Illus.
Idioma: Inglés
Editorial: Springer, 2010
Serie: Libro 25 de 124 - Analog Circuits and Signal Processing
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- Impresión bajo demanda
Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 80,74
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. PRINT ON DEMAND pp. 316.
Idioma: Inglés
Editorial: Springer Netherlands, 2010
Serie: Libro 25 de 124 - Analog Circuits and Signal Processing
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Librería: moluna, Greven, Alemaniamoluna
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EUR 48,74
Envío por EUR 48,99Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Unique combination of design, test, debugging and calibration of A/D converters (probably only on the market)Numerous examples and easy to follow procedure for design, test, debugging and calibration of A/D…convertersBoth state-of-the art software and hardw.
