Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing, 2023
ISBN 10: 620744910X ISBN 13: 9786207449101
Librería: Books Puddle, New York, NY, Estados Unidos de America
EUR 58,61
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Idioma: Inglés
Publicado por OmniScriptum|LAP Lambert Academic Publishing, 2023
ISBN 10: 620744910X ISBN 13: 9786207449101
Librería: moluna, Greven, Alemania
EUR 35,62
Cantidad disponible: Más de 20 disponibles
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Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing, 2023
ISBN 10: 620744910X ISBN 13: 9786207449101
Librería: preigu, Osnabrück, Alemania
EUR 39,35
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Añadir al carritoTaschenbuch. Condición: Neu. Reliability Analysis of Photovoltaic Inverter | Ranjith Kumar Gatla | Taschenbuch | Englisch | 2023 | LAP LAMBERT Academic Publishing | EAN 9786207449101 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.
Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing, 2023
ISBN 10: 620744910X ISBN 13: 9786207449101
Librería: Majestic Books, Hounslow, Reino Unido
EUR 57,72
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Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing Nov 2023, 2023
ISBN 10: 620744910X ISBN 13: 9786207449101
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 43,90
Cantidad disponible: 2 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware 64 pp. Englisch.
Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing, 2023
ISBN 10: 620744910X ISBN 13: 9786207449101
Librería: Biblios, Frankfurt am main, HESSE, Alemania
EUR 57,84
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Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing Nov 2023, 2023
ISBN 10: 620744910X ISBN 13: 9786207449101
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
EUR 43,90
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Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The Reliability of power electronic devices has been an important issue since the early power electronic applications introduced. The power electronic converter plays a crucial role in the failures of a PV system. The unscheduled maintenance failure due to power electronics devices are 37 % of the total failure. In that 31% of the failures are due to the power semi conductor devices. In recent years, many researchers have conducted reliability assessments of power electronic devices, yet the reliability of numerous circuits used widely has not been evaluated. This project presents a comprehensive reliability evaluation of fundamental photo voltaic inverter. The reliability of the inverter is analyzed by calculating the mean time to failure for an IGBT module. The calculation was performed by Parts stress method to achieve better results. In the Parts count method, due to the direct relationship between component failure and temperature; we used PLECS to determine power losses in switches taking into account and the Junction temperature factor.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 64 pp. Englisch.
Idioma: Inglés
Publicado por LAP LAMBERT Academic Publishing, 2023
ISBN 10: 620744910X ISBN 13: 9786207449101
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 44,59
Cantidad disponible: 1 disponibles
Añadir al carritoTaschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The Reliability of power electronic devices has been an important issue since the early power electronic applications introduced. The power electronic converter plays a crucial role in the failures of a PV system. The unscheduled maintenance failure due to power electronics devices are 37 % of the total failure. In that 31% of the failures are due to the power semi conductor devices. In recent years, many researchers have conducted reliability assessments of power electronic devices, yet the reliability of numerous circuits used widely has not been evaluated. This project presents a comprehensive reliability evaluation of fundamental photo voltaic inverter. The reliability of the inverter is analyzed by calculating the mean time to failure for an IGBT module. The calculation was performed by Parts stress method to achieve better results. In the Parts count method, due to the direct relationship between component failure and temperature; we used PLECS to determine power losses in switches taking into account and the Junction temperature factor.