Isbn: 9786202793957 - thin films: study of electronic and optical propertiesof al1-xinxsb thin films (8 resultados)

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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Success of any recent technology, nowadays, is possible only through the accomplishment of semiconductor science advancements. Advancement in any industry, for the past few decades has been based on semiconductor technology and semiconductor devices. The advancement in semiconductor technology necessitates the improvement of new semiconductor materials and the new processing techniques, both in bulk and thin film. The book entitled 'Study of Electronic and Optical Properties of Al1-xInxSb Thin Films' consist of measurement of electrical, thermo electrical and optical properties of Al1-xInxSb films deposited on glass substrate over thickness range of 1000 - 4000 Å by thermal evaporation technique. The properties measured are resistivity, Hall measurement, thermo electric power measurement, I-V characteristics, optical band gap and structural properties. From the data obtained, material parameters have been derived such as grain size, lattice parameters, bulk resistivity, mean free path, activation energy, carrier concentration, conduction type, band gap etc. 164 pp. Englisch.…

Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Success of any recent technology, nowadays, is possible only through the accomplishment of semiconductor science advancements. Advancement in any industry, for the past few decades has been based on semiconductor technology and semiconductor devices. The advancement in semiconductor technology necessitates the improvement of new semiconductor materials and the new processing techniques, both in bulk and thin film. The book entitled 'Study of Electronic and Optical Properties of Al1-xInxSb Thin Films' consist of measurement of electrical, thermo electrical and optical properties of Al1-xInxSb films deposited on glass substrate over thickness range of 1000 - 4000 Å by thermal evaporation technique. The properties measured are resistivity, Hall measurement, thermo electric power measurement, I-V characteristics, optical band gap and structural properties. From the data obtained, material parameters have been derived such as grain size, lattice parameters, bulk resistivity, mean free path, activation energy, carrier concentration, conduction type, band gap etc.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Toda YogeshDr. Dhananjay Gujarathi is renowned Associate Professor and researcher in Physics. He has published various research papers and books on solar cell, crystal growth, thin films and optics in international and National Journ.…

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Taschenbuch. Condición: Neu. Thin Films | Study of Electronic and Optical Propertiesof Al1-xInxSb Thin Films | Yogesh Toda (u. a.) | Taschenbuch | Englisch | 2020 | LAP LAMBERT Academic Publishing | EAN 9786202793957 | Verantwortliche Person für die EU: LAP Lambert Academic Publishing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu Print on Demand.…

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Success of any recent technology, nowadays, is possible only through the accomplishment of semiconductor science advancements. Advancement in any industry, for the past few decades has been based on semiconductor technology and semiconductor devices. The advancement in semiconductor technology necessitates the improvement of new semiconductor materials and the new processing techniques, both in bulk and thin film. The book entitled 'Study of Electronic and Optical Properties of Al1-xInxSb Thin Films' consist of measurement of electrical, thermo electrical and optical properties of Al1-xInxSb films deposited on glass substrate over thickness range of 1000 - 4000 Å by thermal evaporation technique. The properties measured are resistivity, Hall measurement, thermo electric power measurement, I-V characteristics, optical band gap and structural properties. From the data obtained, material parameters have been derived such as grain size, lattice parameters, bulk resistivity, mean free path, activation energy, carrier concentration, conduction type, band gap etc.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 164 pp. Englisch.…