Isbn: 9783662443613 - x-ray absorption spectroscopy of semiconductors: 190 (springer series in optical sciences, 190) (9 resultados)

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  • Idioma: Inglés

    Editorial: Heidelberg, Springer, 2015

    3662443619 / 9783662443613

    Serie: Libro 175 de 235 - Springer Series in Optical Sciences

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    Librería: Antiquariat Bookfarm, Löbnitz, AlemaniaAntiquariat Bookfarm

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    Condición: Usado - Bueno

    EUR 86,23

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    Hardcover. Condición: Gut. Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05847 9783662443613 Sprache: Englisch Gewicht in Gramm: 550.

  • Idioma: Inglés

    Editorial: Springer, 2014

    3662443619 / 9783662443613

    Serie: Libro 175 de 235 - Springer Series in Optical Sciences

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Springer, 2014

    3662443619 / 9783662443613

    Serie: Libro 175 de 235 - Springer Series in Optical Sciences

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    EUR 157,89

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    Cantidad disponible: 2 disponibles

    Hardcover. Condición: Brand New. 2015 edition. 361 pages. 9.25x6.25x1.00 inches. In Stock.

  • Idioma: Inglés

    Editorial: Springer, 2014

    3662443619 / 9783662443613

    Serie: Libro 175 de 235 - Springer Series in Optical Sciences

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

  • Idioma: Inglés

    Editorial: Springer, 2014

    3662443619 / 9783662443613

    Serie: Libro 175 de 235 - Springer Series in Optical Sciences

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    Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books

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    Condición: Usado - Como Nuevo

    EUR 181,28

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    Cantidad disponible: 1 disponibles

    Hardcover. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Idioma: Inglés

    Editorial: Springer, 2014

    3662443619 / 9783662443613

    Serie: Libro 175 de 235 - Springer Series in Optical Sciences

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    Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condición: Nuevo

    EUR 86,24

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    Condición: new. Questo è un articolo print on demand.

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg Nov 2014, 2014

    3662443619 / 9783662443613

    Serie: Libro 175 de 235 - Springer Series in Optical Sciences

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    Condición: Nuevo

    EUR 106,99

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    Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research. 380 pp. Englisch.

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, 2014

    3662443619 / 9783662443613

    Serie: Libro 175 de 235 - Springer Series in Optical Sciences

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    Librería: moluna, Greven, Alemaniamoluna

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    Condición: Nuevo

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    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a complete survey of the current state of the art of X-ray absorption spectroscopy of semiconductorsProvides an overview of a wide range of semiconductor materialsDisplays comprehensive summaries to allow the reader to access the grow.

  • Idioma: Inglés

    Editorial: Springer, Springer Nov 2014, 2014

    3662443619 / 9783662443613

    Serie: Libro 175 de 235 - Springer Series in Optical Sciences

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    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

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    Condición: Nuevo

    EUR 106,99

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    Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases.Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society.The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials.Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 380 pp. Englisch.