9783662228456 - vth international congress on x-ray optics and microanalysis / v. internationaler kongress fur rontgenoptik und mikroanalyse / ve congres internationa de mollenstedt, gottfried (10 resultados)
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Paperback. Condición: Brand New. reprint edition. 624 pages. German language. 9.25x6.10x1.27 inches. In Stock.
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged… in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanforcl. California in 1962, and at Orsay, Francein 1965. The participants in the 1961-l Conferenct came from the following countries: Germany 140, France 60, Great Britain 55, USA 20. Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine. Poland, South Africa. As at the latest congress in Paris the following central topics were treated: Gentral problems of X-ray optics, physical bases of electron beam microanalysis. quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for tht car eful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation.
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Taschenbuch. Condición: Neu. Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l'Optique des Rayons X et la Microanalyse | Gottfried Möllenstedt | Taschenbuch | xii | Deutsch | Springer | EAN 9783662228456 | Verantwortliche P…erson für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Confere…nce was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanforcl. California in 1962, and at Orsay, Francein 1965. The participants in the 1961-l Conferenct came from the following countries: Germany 140, France 60, Great Britain 55, USA 20. Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine. Poland, South Africa. As at the latest congress in Paris the following central topics were treated: Gentral problems of X-ray optics, physical bases of electron beam microanalysis. quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for tht car eful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. 628 pp. Deutsch.
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. X-Ray Optics.- Present State of X-Ray Interferometry.- X-Ray Reflection Optics (Recent Developments).- The Figuring of an Aspherical X-Ray Lens.- Untersuchung zur ASR (Anomalous Surface Reflection) von Roentgenstrahle…n mit einer Mikrofokus-Roentgenroehre.- Gra.
Idioma: Alemán
Editorial: Springer Berlin Heidelberg, Springer Jan 1969 1969
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference…was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanforcl. California in 1962, and at Orsay, Francein 1965. The participants in the 1961-l Conferenct> came from the following countries: Germany 140, France 60, Great Britain 55, USA 20. Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine. Poland, South Africa. As at the latest congress in Paris the following central topics were treated: Gent>ral problems of X-ray optics, physical bases of electron beam microanalysis. quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for tht> car eful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 628 pp. Deutsch.
