ISBN: 9783659308208 - on-chip time-domain metrology in submicron cmos (7 resultados)

Condición: New. pp. 96.

Taschenbuch. Condición: Neu. On-Chip Time-Domain Metrology in Submicron CMOS | Chin-Hsin Lin | Taschenbuch | Englisch | LAP Lambert Academic Publishing | EAN 9783659308208 | Verantwortliche Person für die EU: LAP Lambert Academic Publishing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu. …

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Condición: New. Print on Demand pp. 96 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.

Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - As the complexity and operational speed of today's Systems-on-Chip increase, measuring and characterizing SoC s building blocks are becoming more challenging. Embedded measuring techniques for system characterization, such as built-in self-test, are therefore becoming necessities. A Time-to-Digital Converter (TDC) is a device that has been widely used to measure the time intervals between two signal edges. The measurement resolution of a simple TDC architecture is limited by the minimum gate delay in the IC fabrication process. When the required time measurement resolution is smaller than the minimum gate delay, many TDC architectures include Time Difference Amplifiers (TDA) to pre-amplify the very short input time intervals. However, the gain of the TDA is usually sensitive to process, voltage, and temperature variations. This work researches techniques on improving measurement characteristic of TDCs and demonstrates a single-stage Vernier TDC with a constant gain TDA. The final designed TDC architecture achieves a linear measurement with a 2.5ps time resolution.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Lin Chin-HsinChin-Hsin Eddy Lin received the B.A.Sc degree in electrical engineering from the University of British Columbia, Vancouver, Canada in 2008 and the M.A.Sc. degree in electrical engineering from Simon Fraser University, Bu. …

Condición: New. PRINT ON DEMAND pp. 96.