Isbn: 9783540740797 - applied scanning probe methods viii: scanning probe microscopy techniques (nanoscience and technology) (15 resultados)

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  • Idioma: Inglés

    Editorial: Springer, 2008

    3540740791 / 9783540740797

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    Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

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    Editorial: Springer, 2008

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    Librería: Basi6 International, Irving, TX, Estados Unidos de AmericaBasi6 International

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  • Idioma: Inglés

    Editorial: Springer, 2008

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  • Idioma: Inglés

    Editorial: Springer, 2008

    3540740791 / 9783540740797

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  • Idioma: Inglés

    Editorial: Springer, 2008

    3540740791 / 9783540740797

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    Librería: Romtrade Corp., STERLING HEIGHTS, MI, Estados Unidos de AmericaRomtrade Corp.

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    Condición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

  • Idioma: Inglés

    Editorial: Springer, 2008

    3540740791 / 9783540740797

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  • Idioma: Inglés

    Editorial: Springer, 2008

    3540740791 / 9783540740797

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  • Idioma: Inglés

    Editorial: Springer, 2008

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    Librería: Buchpark, Trebbin, AlemaniaBuchpark

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    Condición: Hervorragend. Zustand: Hervorragend | Seiten: 528 | Sprache: Englisch | Produktart: Bücher | The success of the Springer Series Applied Scanning Probe Methods I¿VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.

  • Idioma: Inglés

    Editorial: Springer, 2008

    3540740791 / 9783540740797

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    EUR 182,28

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    Cantidad disponible: Más de 20 disponibles

    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Springer Verlag, 2008

    3540740791 / 9783540740797

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    EUR 240,59

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    Hardcover. Condición: Brand New. 1st edition. 465 pages. 9.50x6.50x1.00 inches. In Stock.

  • Idioma: Inglés

    Editorial: Springer, 2008

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.

  • Idioma: Inglés

    Editorial: SPRINGER, 2008

    3540740791 / 9783540740797

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    • Edición internacional

    Librería: UK BOOKS STORE, London, LONDO, Reino UnidoUK BOOKS STORE

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    EUR 313,10

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    Condición: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, 2008

    3540740791 / 9783540740797

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    Librería: moluna, Greven, Alemaniamoluna

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    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state-of-the-art of this techniqueReal industrial applications includedThe volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is.

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg Jan 2008, 2008

    3540740791 / 9783540740797

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. 528 pp. Englisch.

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jan 2008, 2008

    3540740791 / 9783540740797

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    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

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    Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The success of the Springer Series Applied Scanning Probe Methods I¿VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 528 pp. Englisch.