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Publicado por Springer, New York, NY, 2007
ISBN 10: 3540373209 ISBN 13: 9783540373209
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Añadir al carritoCloth. Condición: Very Good. 380236 pp. Tightly bound. Corners not bumped. Text is Free of Markings. Published without dust jacket. NOTE: The word "USED" neatly stamped on top fore-edge.
Idioma: Inglés
Publicado por Springer Verlag, Secaucus, New Jersey, U.S.A., 2006
ISBN 10: 3540373209 ISBN 13: 9783540373209
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Añadir al carritoHardcover. Condición: Like New. in original shrinkwrap, papers presented at a conference on scanning probe methods for industrial processes with bw illustrations, tables and graphs Size: 6.25 x 9.5.
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Añadir al carritoCondición: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
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Añadir al carritoCondición: Used. pp. 428 Illus.
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Añadir al carritoCondición: Used. pp. 428.
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Librería: Buchpark, Trebbin, Alemania
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Añadir al carritoCondición: Sehr gut. Zustand: Sehr gut | Seiten: 428 | Sprache: Englisch | Produktart: Bücher | The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I¿IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I¿IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
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Añadir al carritoCondición: Hervorragend. Zustand: Hervorragend | Seiten: 428 | Sprache: Englisch | Produktart: Bücher | The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I¿IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I¿IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
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Idioma: Inglés
Publicado por Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2006
ISBN 10: 3540373209 ISBN 13: 9783540373209
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 160,49
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Añadir al carritoBuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The scanning probe microscopy eld has been rapidly expanding. It is a demanding task to collect a timely overview of this eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near eld Raman spectroscopy and imaging.
Librería: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Alemania
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Añadir al carritoHardcover. Condición: gut. 2006. Applied Scanning Probe Methods VII In deutscher Sprache. pages.
Librería: UK BOOKS STORE, London, LONDO, Reino Unido
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Añadir al carritoCondición: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
Idioma: Inglés
Publicado por Springer Berlin Heidelberg, 2006
ISBN 10: 3540373209 ISBN 13: 9783540373209
Librería: moluna, Greven, Alemania
EUR 132,75
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Añadir al carritoGebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state-of-the-art of this techniqueReal industrial applications includedThe first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing s.
Idioma: Inglés
Publicado por Springer Berlin Heidelberg Okt 2006, 2006
ISBN 10: 3540373209 ISBN 13: 9783540373209
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 160,49
Cantidad disponible: 2 disponibles
Añadir al carritoBuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VII presents 9 chapters on a variety of new and emerging techniques and refinements of SPM applications. 428 pp. Englisch.
Idioma: Inglés
Publicado por Springer Berlin Heidelberg, Springer Berlin Heidelberg Okt 2006, 2006
ISBN 10: 3540373209 ISBN 13: 9783540373209
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
EUR 160,49
Cantidad disponible: 1 disponibles
Añadir al carritoBuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The scanning probe microscopy eld has been rapidly expanding. It is a demanding task to collect a timely overview of this eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I¿IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I¿IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near eld Raman spectroscopy and imaging.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 428 pp. Englisch.