Isbn: 9783540286035 - handbook of practical x-ray fluorescence analysis (6 resultados)

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  • Idioma: Inglés

    Editorial: Springer, 2006

    3540286039 / 9783540286035

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    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

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    EUR 756,03

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    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Springer Verlag, 2006

    3540286039 / 9783540286035

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    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

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    EUR 1060,65

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    Cantidad disponible: 2 disponibles

    Hardcover. Condición: Brand New. 1st edition. 863 pages. 9.00x6.25x1.50 inches. In Stock.

  • Idioma: Inglés

    Editorial: Springer, 2006

    3540286039 / 9783540286035

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    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

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    EUR 794,42

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    Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.…

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    3540286039 / 9783540286035

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    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

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    EUR 748,99

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    Cantidad disponible: 1 disponible

    Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    3540286039 / 9783540286035

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    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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    Cantidad disponible: 2 disponibles

    Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. 904 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer Berlin Heidelberg, 2006

    3540286039 / 9783540286035

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    Librería: moluna, Greven, Alemaniamoluna

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    Condición: Nuevo

    EUR 619,04

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    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and latest&nbspcore reference&nbspin this field Makes it a must for all the analytical laboratories and individual analysts because of its user orientation The most comprehensive and latest core reference in thi.…