Isbn: 9783528081171 - unconventional electron microscopy for molecular structure determination (advances in structure research by diffraction methods) (12 resultados)

Paperback. Condición: New.

Condición: New. In English.

7 volumes. 24 cm. original cloth. approx 1600 pp. many ills. references. index. german and english texts. -(libr label, library stamps, with plasticized cover (einbandfolie), some volumes with slightly browned pages, otherwise (very) good). 777g.

Condición: New. pp. 232.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.…

Paperback. Condición: Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only. 226 pp. Deutsch.…

Condición: New. Print on Demand pp. 232 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

Condición: New. PRINT ON DEMAND pp. 232.

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Instrumentation: Progress and Problems.- Progress in Scanning Transmission Electron Microscopy at the University of Chicago.- The Physics of Specimen Preparation.- Radiation Damage: Experimental Work.- Radiation Damage: The Theoretical Background.- The Elec. …

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.Vieweg+Teubner Verlag, Abraham-Lincoln-Straße 46, 65189 Wiesbaden 232 pp. Deutsch.…

Taschenbuch. Condición: Neu. Unconventional Electron Microscopy for Molecular Structure Determination | W. Hoppe (u. a.) | Taschenbuch | vi | Deutsch | 1979 | Vieweg & Teubner | EAN 9783528081171 | Verantwortliche Person für die EU: Springer Vieweg in Springer Science + Business Media, Abraham-Lincoln-Str. 46, 65189 Wiesbaden, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. …