9783528081171 - unconventional electron microscopy for molecular structure determination (advances in structure research by diffraction methods) de hoppe, w. (13 resultados)
- Tapa blanda
Librería: Basi6 International, Irving, TX, Estados Unidos de AmericaBasi6 International
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 61,70
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 10 disponibles
Condición: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
- Tapa blanda
Librería: Chiron Media, Wallingford, Reino UnidoChiron Media
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 58,71
Envío por EUR 18,13Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 10 disponibles
Paperback. Condición: New.
- Tapa blanda
Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 62,46
Envío por EUR 14,02Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. In.
Idioma: Alemán
Editorial: Vieweg Verlag, Friedr, & Sohn Verlagsgesellschaft mbH, 1979
- Tapa blanda
Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 79,90
Envío por EUR 3,46Se envía dentro de Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. pp. 232.
Editorial: Vieweg 1964-1979., Braunschweig, 1964
- Tapa dura
Librería: Emile Kerssemakers ILAB, Heerlen, HolandaEmile Kerssemakers ILAB
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado
EUR 80,00
Envío por EUR 25,45Se envía de Holanda a Estados Unidos de AmericaCantidad disponible: 1 disponibles
7 volumes. 24 cm. original cloth. approx 1600 pp. many ills. references. index. german and english texts. -(libr label, library stamps, with plasticized cover (einbandfolie), some volumes with slightly browned pages, otherwise (very) good). 777g.
Idioma: Alemán
Editorial: Vieweg+Teubner Verlag, Vieweg+Teubner Verlag, 1979
- Tapa blanda
Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 54,99
Envío por EUR 61,80Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electron microscopes m…onochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.
- Tapa blanda
Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Bueno
EUR 109,69
Envío por EUR 29,26Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Paperback. Condición: Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.
- Tapa blanda
- Impresión bajo demanda
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 54,99
Envío por EUR 23,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electr…on microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only. 226 pp. Deutsch.
Idioma: Alemán
Editorial: Vieweg Verlag, Friedr, & Sohn Verlagsgesellschaft mbH, 1979
- Tapa blanda
- Impresión bajo demanda
Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 79,63
Envío por EUR 7,61Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. Print on Demand pp. 232 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Idioma: Alemán
Editorial: Vieweg Verlag, Friedr, & Sohn Verlagsgesellschaft mbH, 1979
- Tapa blanda
- Impresión bajo demanda
Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
Contactar con el vendedorVendedor de 4 estrellasCondición: Nuevo
EUR 81,58
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. PRINT ON DEMAND pp. 232.
- Tapa blanda
- Impresión bajo demanda
Librería: moluna, Greven, Alemaniamoluna
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 54,99
Envío por EUR 48,99Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Instrumentation: Progress and Problems.- Progress in Scanning Transmission Electron Microscopy at the University of Chicago.- The Physics of Specimen Preparation.- Radiation Damage: Experimental Work.- Radiation Damag…e: The Theoretical Background.- The Elec.
Idioma: Alemán
Editorial: Vieweg+Teubner Verlag, Vieweg+Teubner Verlag Jan 1979, 1979
- Tapa blanda
- Impresión bajo demanda
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 54,99
Envío por EUR 60,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electron m…icroscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.Vieweg+Teubner Verlag, Abraham-Lincoln-Straße 46, 65189 Wiesbaden 232 pp. Deutsch.
Más imágenes- Tapa blanda
- Impresión bajo demanda
Librería: preigu, Osnabrück, Alemaniapreigu
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 54,99
Envío por EUR 70,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 5 disponibles
Taschenbuch. Condición: Neu. Unconventional Electron Microscopy for Molecular Structure Determination | W. Hoppe (u. a.) | Taschenbuch | vi | Deutsch | 1979 | Vieweg & Teubner | EAN 9783528081171 | Verantwortliche Person für die EU: Springer Vieweg in Springer Science + Business Media, Abraham-Lincoln-Str. 46, 65189 Wiesbaden, j…uergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
