9783527334636 - materials characterization 2e: introduction to microscopic and spectroscopic methods de leng (30 resultados)
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Librería: BooksRun, Philadelphia, PA, Estados Unidos de AmericaBooksRun
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EUR 46,76
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Hardcover. Condición: Very Good. 2. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
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Librería: HPB-Red, Dallas, TX, Estados Unidos de AmericaHPB-Red
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EUR 45,68
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Hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
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Librería: Textbooks_Source, Columbia, MO, Estados Unidos de AmericaTextbooks_Source
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EUR 45,68
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hardcover. Condición: Good. 2nd Edition. Ships in a BOX from Central Missouri! May not include working access code. Will not include dust jacket. Has used sticker(s) and some writing or highlighting. UPS shipping for most packages, (Priority Mail for AK/HI/APO/PO Boxes).
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Librería: BookHolders, Towson, MD, Estados Unidos de AmericaBookHolders
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EUR 52,53
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Condición: Good. [ No Hassle 30 Day Returns ][ Ships Daily ] [ Underlining/Highlighting: NONE ] [ Writing: NONE ] [ Edition: second ] Publisher: Wiley-VCH Pub Date: 10/28/2013 Binding: Hardcover Pages: 392 second edition.
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Librería: Goodwill of Silicon Valley, SAN JOSE, CA, Estados Unidos de AmericaGoodwill of Silicon Valley
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EUR 49,28
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Condición: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
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Librería: Patrico Books, Apollo Beach, FL, Estados Unidos de AmericaPatrico Books
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EUR 50,21
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hardcover. Condición: Very Good. Ships Out Tomorrow.
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 86,20
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Condición: New.
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Librería: Textbooks_Source, Columbia, MO, Estados Unidos de AmericaTextbooks_Source
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EUR 84,99
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hardcover. Condición: New. 2nd Edition. Ships in a BOX from Central Missouri! UPS shipping for most packages, (Priority Mail for AK/HI/APO/PO Boxes).
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Librería: PBShop.store UK, Fairford, GLOS, Reino UnidoPBShop.store UK
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EUR 87,89
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HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de AmericaGreatBookPrices
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EUR 95,88
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Condición: As New. Unread book in perfect condition.
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 87,88
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Condición: New.
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Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 95,56
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Condición: new.
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Librería: Chiron Media, Wallingford, Reino UnidoChiron Media
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EUR 88,17
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Paperback. Condición: New.
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 94,15
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Condición: New. In.
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Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de AmericaGrand Eagle Retail
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EUR 109,51
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Hardcover. Condición: new. Hardcover. Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept…of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience. While this second edition retains the successful didactical concept of its predecessor, all the sections have been thoroughly revised, updated and expanded, with two major new topics, plus 50 additional questions - in total around 20% new content. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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EUR 104,30
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Condición: New. pp. 392.
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Librería: GreatBookPricesUK, Woodford Green, Reino UnidoGreatBookPricesUK
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EUR 95,71
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Condición: As New. Unread book in perfect condition.
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Librería: Speedyhen, Hertfordshire, Reino UnidoSpeedyhen
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EUR 75,57
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Condición: NEW.
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Librería: Rarewaves.com USA, London, LONDO, Reino UnidoRarewaves.com USA
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EUR 124,57
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Hardback. Condición: New. Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introduct…ions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 127,66
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Condición: New. pp. 392 2nd Edition.
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 124,66
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Condición: New. pp. 392.
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Librería: moluna, Greven, Alemaniamoluna
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EUR 105,00
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Gebunden. Condición: New. Yang Leng is Professor, specialized in materials science and engineering, at The Hong Kong University of Science and Technology (HKUST). His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials process.
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Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 148,15
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Condición: New. While this second edition retains the successful didactical concept of its predecessor, all the sections have been thoroughly revised, updated and expanded, with two major new topics, plus 50 additional questions - in total around 20% new content. Num Pages: 392 pages, illustrations. BIC Classification: TGM. Cate…gory: (P) Professional & Vocational. Dimension: 247 x 176 x 24. Weight in Grams: 988. . 2013. 2nd Edition. Hardcover. . . . .
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 121,04
Envío por EUR 64,38Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 2 disponibles
Buch. Condición: Neu. Neuware - Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of int…roductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.
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Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore
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EUR 184,10
Envío por EUR 9,19Se envía dentro de Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. While this second edition retains the successful didactical concept of its predecessor, all the sections have been thoroughly revised, updated and expanded, with two major new topics, plus 50 additional questions - in total around 20% new content. Num Pages: 392 pages, illustrations. BIC Classification: TGM. Cate…gory: (P) Professional & Vocational. Dimension: 247 x 176 x 24. Weight in Grams: 988. . 2013. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.
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Librería: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller
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EUR 160,90
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Hardcover. Condición: new. Hardcover. Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept…of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience. While this second edition retains the successful didactical concept of its predecessor, all the sections have been thoroughly revised, updated and expanded, with two major new topics, plus 50 additional questions - in total around 20% new content. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Librería: Rarewaves.com UK, London, Reino UnidoRarewaves.com UK
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EUR 117,14
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Hardback. Condición: New. Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introduct…ions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 195,58
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Hardcover. Condición: Brand New. 2nd edition. 376 pages. 10.00x7.25x1.00 inches. In Stock.
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 109,59
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Hardcover. Condición: Brand New. 2nd edition. 376 pages. 10.00x7.25x1.00 inches. In Stock. This item is printed on demand.
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 115,53
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Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
