Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

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9783527334636: Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.

The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content.

The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis.

The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.

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About the Author:

Yang Leng is Professor, specialized in materials science and engineering, at The Hong Kong University of Science and Technology (HKUST). His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials processing. Professor Leng has extensively published in international journals. In addition, he has actively engaged in industrial consultancy. His contribution to teaching materials science and engineering is exemplified by the Teaching Excellence Appreciation award from the HKUST.

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Descripción Wiley-VCH Verlag GmbH. Hardback. Estado de conservación: new. BRAND NEW, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods (2nd Revised edition), Yang Leng, Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text that never loses sight of its intended audience. Nº de ref. de la librería B9783527334636

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Descripción Estado de conservación: New. Publisher/Verlag: Wiley-VCH | Introduction to Microscopic and Spectroscopic Methods | While this second edition retains the successful didactical concept of its predecessor, all the sections have been thoroughly revised, updated and expanded, with two major new topics, plus 50 additional questions - in total around 20% new content. | Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content.The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis.The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience. | PREFACELIGHT MICROSCOPYOptical PrinciplesInstrumentationSpecimen PreparationImaging ModesConfocal MicroscopyX-RAY DIFFRACTION METHODSX-Ray RadiationTheoretical Background of DiffractionX-Ray DiffractometryWide-Angle X-Ray Diffraction and ScatteringTRANSMISSION ELECTRON MICROSCOPYInstrumentationSpecimen PreparationImage ModesSelected-Area Diffraction (SAD)Images of Crystal DefectsSCANNING ELECTRON MICROSCOPYInstrumentationContrast FormationOperational VariablesSpecimen PreparationElectron Backscatter DiffractionEnvironmental SEMSCANNING PROBE MICROSCOPYInstrumentationScanning Tunneling MicroscopyAtomic Force MicroscopyImage ArtifactsX-RAY SPECTROSCOPY FOR ELEMENTAL ANALYSISFeatures of Characteristic X-RaysX-Ray Fluorescence SpectrometryEnergy Dispersive Spectroscopy in Electron MicroscopesQualitative and Quantitative AnalysisELECTRON SPECTROSCOPY FOR SURFACE ANALYSISBasic PrinciplesInstrumentationCharacteristics of Electron SpectraQualitative and Quantitative AnalysisSECONDARY ION MASS SPECTROMETRY FOR SURFACE ANALYSISBasic PrinciplesInstrumentationSurface Structure AnalysisSIMS ImagingSIMS Depth ProfilingVIBRATIONAL SPECTROSCOPY FOR MOLECULAR ANALYSISTheoretical BackgroundFourier Transform Infrared SpectroscopyRaman MicroscopyInterpretation of Vibrational SpectraTHERMAL ANALYSISCommon CharacteristicsDifferential Thermal Analysis and Differential Scanning CalorimetryThermogravimetryINDEX | Format: Hardback | Language/Sprache: english | 991 gr | 252x173x25 mm | 392 pp. Nº de ref. de la librería K9783527334636

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Descripción Wiley-VCH, 2013. Hardcover. Estado de conservación: New. Nº de ref. de la librería BKTY9783527334636

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