ISBN: 9783319819860 - physical principles of electron microscopy: an introduction to tem, sem, and aem (16 resultados)

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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.…

Taschenbuch. Condición: Neu. Physical Principles of Electron Microscopy | An Introduction to TEM, SEM, and AEM | R. F. Egerton | Taschenbuch | xi | Englisch | 2018 | Springer | EAN 9783319819860 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Broschiert. Condición: Neu. 196 S. Neu. Ungelesen. Ein Rechnungsbeleg mit ausgew. MwSt. liegt der Lieferung bei. R_hobby 9783319819860 . Bei Mehrfachbestellungen bei uns, reduziert sich für Sie der Versandkostenanteil pro Titel. Sprache: Deutsch Gewicht in Gramm: 390 Softcover reprint of the original 2nd ed. 2016.…

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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy. 208 pp. Englisch.…

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Thoroughly revised and updated from the popular 2005 edition, this textbook introduces both the theory and current practice of electron microscopy Contains expanded reference lists as a launch point into the specialist literatureRequires on.…

Condición: New. Print on Demand pp. 207.

Condición: New. PRINT ON DEMAND pp. 207.

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 208 pp. Englisch.…