ISBN: 9783319808482 - soft error mechanisms, modeling and mitigation (12 resultados)

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Condición: New. pp. XI, 105 81 illus., 35 illus. in color. Softcover reprint of the original 1st ed. 2016 edition NO-PA16APR2015-KAP.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.…

Taschenbuch. Condición: Neu. Soft Error Mechanisms, Modeling and Mitigation | Selahattin Sayil | Taschenbuch | xi | Englisch | 2018 | Springer | EAN 9783319808482 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time. 105 pp. Englisch.…

Condición: New. Print on Demand pp. XI, 105 81 illus., 35 illus. in color.

Condición: New. PRINT ON DEMAND pp. XI, 105 81 illus., 35 illus. in color.

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced jitter and race, single event coupling noise, delay and speed-up effects and then compares coupling induced noise and delay effects to single event trans.…