Isbn: 9783319753751 - spectroscopic ellipsometry for photovoltaics: volume 1: fundamental principles and solar cell characterization: 212 (springer series in optical sciences, 212) (7 resultados)

Hardcover. Condición: Gut. XX, 594. 336 illus., 266 illus. in color Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02516 9783319753751 Sprache: Englisch Gewicht in Gramm: 1150.

Condición: New. In English.

Hardcover. Condición: Brand New. 616 pages. 9.25x6.10x1.57 inches. In Stock.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations.It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.…

Condición: new. Questo è un articolo print on demand.

Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations.It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers. 616 pp. Englisch. …

Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Presents ellipsometry characterization of solar cell materials/devicesProvides easy-to-understand explanations of ellipsometry data analysisIncludes optical constants for all solar-cell component layersSpringer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 616 pp. Englisch.…