9783319006802 - exploring memory hierarchy design with emerging memory technologies: 267 (lecture notes in electrical engineering, 267) de sun, guangyu (10 resultados)

Idioma: Inglés
Editorial: Springer 2013
Serie: Lecture Notes in Electrical Engineering, Libro 101 de 548. Libro 101 de 548 - Lecture Notes in Electrical Engineering
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Librería: Romtrade Corp., STERLING HEIGHTS, Estados Unidos de AmericaRomtrade Corp.
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Idioma: Inglés
Editorial: Springer 2013
Serie: Lecture Notes in Electrical Engineering, Libro 101 de 548. Libro 101 de 548 - Lecture Notes in Electrical Engineering
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Librería: Basi6 International, Irving, Estados Unidos de AmericaBasi6 International
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Idioma: Inglés
Editorial: Springer 2013
Serie: Lecture Notes in Electrical Engineering, Libro 101 de 548. Libro 101 de 548 - Lecture Notes in Electrical Engineering
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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Idioma: Inglés
Editorial: Springer Verlag 2013
Serie: Lecture Notes in Electrical Engineering, Libro 101 de 548. Libro 101 de 548 - Lecture Notes in Electrical Engineering
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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Hardcover. Condición: Brand New. 2014 edition. 140 pages. 9.25x6.25x0.50 inches. In Stock.

Idioma: Inglés
Editorial: Springer 2013
Serie: Lecture Notes in Electrical Engineering, Libro 101 de 548. Libro 101 de 548 - Lecture Notes in Electrical Engineering
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Librería: Buchpark, Trebbin, AlemaniaBuchpark
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Condición: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques describ…ed offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the ¿memory wall.¿ The authors discuss memory design from various perspectives: emerging memory technologies are employed in the memory hierarchy with novel architecture modification; hybrid memory structure is introduced to leverage advantages from multiple memory technologies; an analytical model named ¿Moguls¿ is introduced to explore quantitatively the optimization design of a memory hierarchy; finally, the vulnerability of the CMPs to radiation-based soft errors is improved by replacing different levels of on-chip memory with STT-RAMs.

Idioma: Inglés
Editorial: Springer International Publishing 2013
Serie: Lecture Notes in Electrical Engineering, Libro 101 de 548. Libro 101 de 548 - Lecture Notes in Electrical Engineering
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 106,99
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques described offer… advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the 'memory wall.' The authors discuss memory design from various perspectives: emerging memory technologies are employed in the memory hierarchy with novel architecture modification; hybrid memory structure is introduced to leverage advantages from multiple memory technologies; an analytical model named 'Moguls' is introduced to explore quantitatively the optimization design of a memory hierarchy; finally, the vulnerability of the CMPs to radiation-based soft errors is improved by replacing different levels of on-chip memory with STT-RAMs.

Idioma: Inglés
Editorial: Springer 2013
Serie: Lecture Notes in Electrical Engineering, Libro 101 de 548. Libro 101 de 548 - Lecture Notes in Electrical Engineering
- Tapa dura
Librería: Buchpark, Trebbin, AlemaniaBuchpark
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Condición: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques… described offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the ¿memory wall.¿ The authors discuss memory design from various perspectives: emerging memory technologies are employed in the memory hierarchy with novel architecture modification; hybrid memory structure is introduced to leverage advantages from multiple memory technologies; an analytical model named ¿Moguls¿ is introduced to explore quantitatively the optimization design of a memory hierarchy; finally, the vulnerability of the CMPs to radiation-based soft errors is improved by replacing different levels of on-chip memory with STT-RAMs.

Idioma: Inglés
Editorial: Springer International Publishing Okt 2013 2013
Serie: Lecture Notes in Electrical Engineering, Libro 101 de 548. Libro 101 de 548 - Lecture Notes in Electrical Engineering
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques… described offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the 'memory wall.' The authors discuss memory design from various perspectives: emerging memory technologies are employed in the memory hierarchy with novel architecture modification; hybrid memory structure is introduced to leverage advantages from multiple memory technologies; an analytical model named 'Moguls' is introduced to explore quantitatively the optimization design of a memory hierarchy; finally, the vulnerability of the CMPs to radiation-based soft errors is improved by replacing different levels of on-chip memory with STT-RAMs. 132 pp. Englisch.

Idioma: Inglés
Editorial: Springer International Publishing 2013
Serie: Lecture Notes in Electrical Engineering, Libro 101 de 548. Libro 101 de 548 - Lecture Notes in Electrical Engineering
- Tapa dura
- Impresión bajo demanda
Librería: moluna, Greven, Alemaniamoluna
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EUR 92,27
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a holistic study of using emerging memory technologies in different levels of the memory hierarchyEquips readers with techniques for memory design with improved performance, energy consumption, and…reliabilityIncludes coverage of a.

Idioma: Inglés
Editorial: Springer, Springer Okt 2013 2013
Serie: Lecture Notes in Electrical Engineering, Libro 101 de 548. Libro 101 de 548 - Lecture Notes in Electrical Engineering
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Librería: buchversandmimpf2000, Emtmannsberg, Alemaniabuchversandmimpf2000
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EUR 106,99
Envío por EUR 60,00Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques des…cribed offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the ¿memory wall.¿ The authors discuss memory design from various perspectives: emerging memory technologies are employed in the memory hierarchy with novel architecture modification; hybrid memory structure is introduced to leverage advantages from multiple memory technologies; an analytical model named ¿Moguls¿ is introduced to explore quantitatively the optimization design of a memory hierarchy; finally, the vulnerability of the CMPs to radiation-based soft errors is improved by replacing different levels of on-chip memory with STT-RAMs.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 132 pp. Englisch.