Isbn: 9781461346395 - a unified approach for timing verification and delay fault testing (9 resultados)

ISBN: 
Refinar con la Búsqueda avanzada

Filtrar la búsqueda

  • Libros (9)

a

Intervalo de precios personalizado (EUR)

a

  • Idioma: Inglés

    Editorial: Springer, 2012

    1461346398 / 9781461346395

    • Tapa blanda

    Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 128,71

    Envío por EUR 10,97 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: Más de 20 disponibles

    Condición: New. In English.

  • Idioma: Inglés

    Editorial: Springer, 2012

    1461346398 / 9781461346395

    • Tapa blanda

    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 117,28

    Envío por EUR 35,00 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 1 disponible

    Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.…

  • Más imágenes

    Idioma: Inglés

    Editorial: Springer, 2012

    1461346398 / 9781461346395

    • Tapa blanda

    Librería: preigu, Osnabrück, Alemaniapreigu

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 95,25

    Envío por EUR 70,00 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 5 disponibles

    Taschenbuch. Condición: Neu. A Unified Approach for Timing Verification and Delay Fault Testing | Mukund Sivaraman (u. a.) | Taschenbuch | xv | Englisch | 2012 | Springer | EAN 9781461346395 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

  • Idioma: Inglés

    Editorial: Springer US, 2012

    1461346398 / 9781461346395

    • Tapa blanda

    Librería: Buchpark, Trebbin, AlemaniaBuchpark

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Usado - Excelente

    EUR 81,18

    Envío por EUR 105,00 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 1 disponible

    Condición: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.…

  • Idioma: Inglés

    Editorial: Springer, 2012

    1461346398 / 9781461346395

    • Tapa blanda

    Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books

    Vendedor de 4 estrellas
    Contactar con el vendedor

    Condición: Usado - Como Nuevo

    EUR 183,34

    Envío por EUR 29,28 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: 1 disponible

    Paperback. Condición: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Idioma: Inglés

    Editorial: Springer, 2012

    1461346398 / 9781461346395

    • Tapa blanda
    • Impresión bajo demanda

    Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 86,24

    Envío por EUR 5,50 
    Se envía de Italia a Estados Unidos de America

    Cantidad disponible: Más de 20 disponibles

    Condición: new. Questo è un articolo print on demand.

  • Idioma: Inglés

    Editorial: Springer US Sep 2012, 2012

    1461346398 / 9781461346395

    • Tapa blanda
    • Impresión bajo demanda

    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 106,99

    Envío por EUR 23,00 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 2 disponibles

    Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing. 176 pp. Englisch.…

  • Idioma: Inglés

    Editorial: Springer US, 2012

    1461346398 / 9781461346395

    • Tapa blanda
    • Impresión bajo demanda

    Librería: moluna, Greven, Alemaniamoluna

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 92,27

    Envío por EUR 48,99 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: Más de 20 disponibles

    Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in .…

  • Idioma: Inglés

    Editorial: Springer, Springer New York Sep 2012, 2012

    1461346398 / 9781461346395

    • Tapa blanda
    • Impresión bajo demanda

    Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemaniabuchversandmimpf2000

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 106,99

    Envío por EUR 60,00 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 1 disponible

    Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts.A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation.A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers.A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model.A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits.The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 176 pp. Englisch. …